The manual probers can test all types of single die or several dies on an entire or partial wafer up to 300 mm
• Manual motion of the vacuum chuck and of the microscope
• Basic low-cost model, or economical multi-applications or submicronic high precision
• Specific configurations for demanding tests : low current, high power...
• Configurable and upgradable with choice of options : Thermal chuck, triaxial connections, isolating box (dark box)...
• Standard frequency DC or high frequency (RF)