Paul has recently joined our Sales Team as Semiconductor materials and technology specialist, please welcome him on-board
Some New products arriving soon : Thermal conditioning systems for temperature characterisation, 4-Point-Probe with Evolutive customised software…
Next shows events : ERMS Nice France 27-31 September, EuMW European Microwave Week Paris France 1-3 October

Analytical Manual Probe Stations

The manual probers can test all types of single die or several dies on an entire or partial wafer up to 300 mm • Manual motion of the vacuum chuck and of the microscope • Basic low-cost model, or economical multi-applications or submicronic high precision • Specific configurations for demanding tests : low current, high power... • Configurable and upgradable with choice of options : Thermal chuck, triaxial connections, isolating box (dark box)... • Standard frequency DC or high frequency (RF)
Manual economical probe station
H1xx
Manual economical probe station
  • Wafer size : Individual die, partial wafer, max 100 mm

Economical probe station available in three models for wafers up to 100 mm X-Y travels of 100 mmQuick platen liftUp to 6 micropositioners and a probecard ...

General purpose probe station
S1160-x
General purpose probe station
  • Wafer size : Individual die, partial wafer, max 200 mm
  • Chuck travel X-Y : 200/300 mm

The S1160 will support a broad range of precision probing applications including IV, CV, dies, wafers... Modular, it can accept many options and accessories for multi-purpose (temperature, low current...) applications Accept basic microscope (bino / trino) or high power multi-objectives microscopeQuick platen lift allows replacing the wafer under test easilyHigh frequency RF version available WL11...

Manual RF probe station
WL1160-x
Manual RF probe station
  • Wafer size : Puce individuelle, wafer partiel, max 150 mm

Economical while professional prober for RF and Microwave probing applications, available for single die, partial or full wafer up to 8" Stable platen and specific anti-resonant constructionIndividual chuck for RF needles and cables calibrationQuick platen lift and fine Z adjustmentAccepts RF positioners and DC simultaneouslyHigh-power microscope (multi-objectives) or stereozoom trinocular (Tilt-...

High stability DC or RF probe station
CM170/WL170
High stability DC or RF probe station
  • Wafer size : Individual die, partial wafer, max 200 mm

The CM170(WL170) is a combination of the submicronic model CM210 / WL210 and the economical S1160 / WL1160 filling the gap between these 2 extremes A perfect prober for a moderate costAll the advantages of a sophisticated system at a lower costWill accept up to 10 RF or DC micropositionersCompatible with the PowerPro option (High Power Measurements) ...

Submicronic checkmate probe station
CM210/310
Submicronic checkmate probe station
  • Wafer size : 200 mm
  • Theta range : +- 7.5 Degrees
  • Movement : Manual

The Checkmate serie represents the state of the art for probing stations, available for probing on individual die or on wafer up to 8" or 12". The probe stations allow high performance for pads probing or internal linesOn-site upgradability from one version to anotherA variety of options and accessories will fulfill all applications, including cold characterization @-65°C and femtoamp measuremen...

Manual probe station with local chamber
WL210e/310e
Manual probe station with local chamber
  • Wafer size : 200
  • Option : Hot/cold chuck, PowerPro

This probe station is derivated of the submicronic Checkmate series. It includes an additional local chamber that allow temperature measurement (hot/cold) or very low current application The chuck movements are motorized to keep high precision movementsThe WL210e is compatible with our High Power PowerPro configurationModel WL210e => Up to 200 mm wafer, WL310e => 300 mm ...

Wavelink microwave submicronic probe station
WL210/310
Wavelink microwave submicronic probe station
  • Wafer size : 200

Microwave analytical wafer probing for accurate S-Parameter, load-pull, 1/f, noise-figure measurements and many others. The WL serie is the platform of choice with thermal, shielded and local-enclosure options available.  200mm version => WL210, 300mm => WL310High frequency mandates that probe placement do not introduce parasitic errors which can effect yield, the WL210/310 has been designed to ...

Economical probe stations for single chip or wafer up to 200 mm, for geometry of pads or lines of few microns • Standard manual DC versions or high frequency microwave model • The microscope post accepts bino type (basic) or high power type (turret multi-objectives on SS160 only) • Up to 10 positioners (upon model) with magnetic or vacuum base • Optional thermal chuck for temperature applications • Range of accessories and options
Manual economical probe station
H1xx
Manual economical probe station
  • Wafer size : Individual die, partial wafer, max 100 mm

Economical probe station available in three models for wafers up to 100 mm X-Y travels of 100 mmQuick platen liftUp to 6 micropositioners and a probecard ...

General purpose probe station
S1160-x
General purpose probe station
  • Wafer size : Individual die, partial wafer, max 200 mm
  • Chuck travel X-Y : 200/300 mm

The S1160 will support a broad range of precision probing applications including IV, CV, dies, wafers... Modular, it can accept many options and accessories for multi-purpose (temperature, low current...) applications Accept basic microscope (bino / trino) or high power multi-objectives microscopeQuick platen lift allows replacing the wafer under test easilyHigh frequency RF version available WL11...

Manual RF probe station
WL1160-x
Manual RF probe station
  • Wafer size : Puce individuelle, wafer partiel, max 150 mm

Economical while professional prober for RF and Microwave probing applications, available for single die, partial or full wafer up to 8" Stable platen and specific anti-resonant constructionIndividual chuck for RF needles and cables calibrationQuick platen lift and fine Z adjustmentAccepts RF positioners and DC simultaneouslyHigh-power microscope (multi-objectives) or stereozoom trinocular (Tilt-...

A range of submicronic probe stations of high precision and accuracy for tests on small pads or very small internal nodes. Accepts from individual die to partial wafer or entire wafer up to 12" • Solid base providing a low level of noise once seated on a vibration table • Several configurations of chuck, standard, triax, thermally controlled... • Can accept high-end positioners for an optimum accuracy • Custom configurations upon specsheet  
High stability DC or RF probe station
CM170/WL170
High stability DC or RF probe station
  • Wafer size : Individual die, partial wafer, max 200 mm

The CM170(WL170) is a combination of the submicronic model CM210 / WL210 and the economical S1160 / WL1160 filling the gap between these 2 extremes A perfect prober for a moderate costAll the advantages of a sophisticated system at a lower costWill accept up to 10 RF or DC micropositionersCompatible with the PowerPro option (High Power Measurements) ...

Submicronic checkmate probe station
CM210/310
Submicronic checkmate probe station
  • Wafer size : 200 mm
  • Theta range : +- 7.5 Degrees
  • Movement : Manual

The Checkmate serie represents the state of the art for probing stations, available for probing on individual die or on wafer up to 8" or 12". The probe stations allow high performance for pads probing or internal linesOn-site upgradability from one version to anotherA variety of options and accessories will fulfill all applications, including cold characterization @-65°C and femtoamp measuremen...

Manual probe station with local chamber
WL210e/310e
Manual probe station with local chamber
  • Wafer size : 200
  • Option : Hot/cold chuck, PowerPro

This probe station is derivated of the submicronic Checkmate series. It includes an additional local chamber that allow temperature measurement (hot/cold) or very low current application The chuck movements are motorized to keep high precision movementsThe WL210e is compatible with our High Power PowerPro configurationModel WL210e => Up to 200 mm wafer, WL310e => 300 mm ...

Wavelink microwave submicronic probe station
WL210/310
Wavelink microwave submicronic probe station
  • Wafer size : 200

Microwave analytical wafer probing for accurate S-Parameter, load-pull, 1/f, noise-figure measurements and many others. The WL serie is the platform of choice with thermal, shielded and local-enclosure options available.  200mm version => WL210, 300mm => WL310High frequency mandates that probe placement do not introduce parasitic errors which can effect yield, the WL210/310 has been designed to ...

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171