Analytical Manual Probe Stations

• Wafer size : Individual die, partial wafer, max 100 mm

Economical probe station available in three models for wafers up to 100 mm X-Y travels of 100 mmQuick platen liftUp to 6 micropositioners and a probecard ...

• Wafer size : Individual die, partial wafer, max 200 mm
  
• Chuck travel X-Y : 200/300 mm

The S1160 will support a broad range of precision probing applications including IV, CV, dies, wafers... Modular, it can accept many options and accessories for multi-purpose (temperature, low current...) applications Accept basic microscope (bino / trino) or high power multi-objectives microscopeQuick platen lift allows replacing the wafer under test easilyHigh frequency RF version available WL11...

• Wafer size : Puce individuelle, wafer partiel, max 150 mm

Economical while professional prober for RF and Microwave probing applications, available for single die, partial or full wafer up to 8" Stable platen and specific anti-resonant constructionIndividual chuck for RF needles and cables calibrationQuick platen lift and fine Z adjustmentAccepts RF positioners and DC simultaneouslyHigh-power microscope (multi-objectives) or stereozoom trinocular (Tilt-...

• Wafer size : Individual die, partial wafer, max 200 mm

The CM170(WL170) is a combination of the submicronic model CM210 / WL210 and the economical S1160 / WL1160 filling the gap between these 2 extremes A perfect prober for a moderate costAll the advantages of a sophisticated system at a lower costWill accept up to 10 RF or DC micropositionersCompatible with the PowerPro option (High Power Measurements) ...

• Wafer size : 200 mm
  
• Theta range : +- 7.5 Degrees
  
• Movement : Manual

The Checkmate serie represents the state of the art for probing stations, available for probing on individual die or on wafer up to 8" or 12". The probe stations allow high performance for pads probing or internal linesOn-site upgradability from one version to anotherA variety of options and accessories will fulfill all applications, including cold characterization @-65°C and femtoamp measuremen...

• Wafer size : 200
  
• Option : Hot/cold chuck, PowerPro

This probe station is derivated of the submicronic Checkmate series. It includes an additional local chamber that allow temperature measurement (hot/cold) or very low current application The chuck movements are motorized to keep high precision movementsThe WL210e is compatible with our High Power PowerPro configurationModel WL210e => Up to 200 mm wafer, WL310e => 300 mm ...

• Wafer size : 200

Microwave analytical wafer probing for accurate S-Parameter, load-pull, 1/f, noise-figure measurements and many others. The WL serie is the platform of choice with thermal, shielded and local-enclosure options available.  200mm version => WL210, 300mm => WL310High frequency mandates that probe placement do not introduce parasitic errors which can effect yield, the WL210/310 has been designed to ...