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Equipment's for Mercury contact Probing

EQUIPMENT FOR THIN LAYER CHARACTERIZATION - Equipment's for Mercury contact Probing

The CVMap serie systems allow measuring-characterizing-monitoring a number of parameters of semiconductors materials and of processes
• Compatible for all wafer or substrate size up to 12'
• Manual or automatic loading
• Specific models with 3-Point-Contact allow characterization on isolated substrates (SOI...)
• A serie of models combine resistivity measurements by Mercury Probe with C(V) measurements
The Mercury Contact Probe is a soft contact that will eliminate the potential damage caused by Needles on sensitive layers
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171