NEW ! Thermal forcing system providing hot and cold temperature
Our Test and burn-in Sockets accommodate ALL packages, Standard or Custom
NEW : Ovens and burn in chamber for bringing temperatures on devices or sub-assemblies

EQUIPMENT FOR THIN LAYER CHARACTERIZATION

Equipment and materials for electrical characterization of thin semiconductive layers. The four-point-probe technic, Hall effect or Mercury probing allow measuring and monitoring the layers response to electrical stimuli and determine the devices functionality.

Request information about : EQUIPMENT FOR THIN LAYER CHARACTERIZATION

You have the right to access, modify, amend and delete information about yourself (art. 34 of the "Freedom and Information" act). In order to exercise this right you can contact: Microworld – 5 Rue de la Verrerie, 38120 Fontanil-Cornillon - Tel: 04 76 56 16 17

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171