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Other (connecting, vacuum, specific chucks...)

ACCESSORIES FOR PROBE STATIONS - Other (connecting, vacuum, specific chucks...)

A variety of accessories dedicated to probers will help personnalizing your configuration in function of your specific applications
• Adapted chuck for high power measurements or trixial depending on test requirements
• Hardware support for probecards or printed-circuit-boards
• Coaxial or High frequency cables
• Etc...
MW-ERS-AC3
Thermal chuck
Thermal chuck
For 50 years ERS has been developing thermal chucks compatible with all probetest stations.

They have the following properties :
- High temperature: 300 ° C
- Low temperature: Patented airflow technology allows cooling down to -60 ° C
- Chuck TRIAX for low current measurement (FemtoAmp)
- Chuck High Voltage
- Non magnetic chuck
HPCHUCK
High power chuck
High power chuck
The high power chuck has been designed for use when probing at high voltage or high current.

- 150, 200 or 300 mm size available
- For very high voltage measurement (10KV)
TRXCHUCK
Triaxial chuck
Triaxial chuck
The triaxial chuck will allow ultra-low current measurement down to fA when used with specific micropositioners with trixial arm and hermetic box for light and shield isolation.

- It is composed of 3 parts of which the middle part can be polarized,
- A high-temperature version is also available when associated with a hot or tri-temp chuck
- Available for wafers up to 300 mm (12")
- The triaxial chuck typically replaces the standard chuck onto a manual or semi-automatic prober to perform low level current measurement.

S47xx
Probe card adapter
Probe card adapter
Mechanical fixture for mounting a probecard of 4.5" width (114 mm) on a prober.

- Provide signals to the DUT while making analysis with separate needles controlled from micropositionners
- 2 models are available, one with no adjustment, another with theta adjustment

CM-BMC
Board mount chuck
Board mount chuck
This PCB board holder permit to fix electronic board already mounted with components on a probe station.

Probecard
Probe card
Probe card
The probecards fullfill all production probing applications and particularly the highly demanding nowadays circuits : high pincount, ultra-fine pitch, multi-DUT testing, specific constraint (low-k, probe over active area....).

- Pcb design available for custom boards (all commercial testers)
- All services of specific design, manufacture, diagnostic and repair, alignment...
- Available for pads test or bumps tests
SSMC-BNC-x
Coaxial Patch Cable for SSMC to BNC
Coaxial Patch Cable for SSMC to BNC
SSMC coaxial cable

- Coaxial cable RG174
- SSMC female connector to BNC male connectors
- Standard length 1 m (others available from 30cm to 2m)
M-VAC
Vacuum pump
Vacuum pump
Convenient and silencious, this vacuum pump will provide vacuum to prober chucks or other equipment.

- Suitable for any vacuum held devices needing a basic vacuum
- The vacuum provided is 25", sufficient to supply a vacuum chuck and several vacuum-based micropositionners
They are proposed when the test requirements demand a specific configuration for non-standard parameters
• Applications for low current, high power
• Specific models for temperatures, hot or hot/cold with cooling down circuit
• Custom manufacture for components with a specific shape, or non standard dimensions...
MW-ERS-AC3
Thermal chuck
Thermal chuck
For 50 years ERS has been developing thermal chucks compatible with all probetest stations.

They have the following properties :
- High temperature: 300 ° C
- Low temperature: Patented airflow technology allows cooling down to -60 ° C
- Chuck TRIAX for low current measurement (FemtoAmp)
- Chuck High Voltage
- Non magnetic chuck
HPCHUCK
High power chuck
High power chuck
The high power chuck has been designed for use when probing at high voltage or high current.

- 150, 200 or 300 mm size available
- For very high voltage measurement (10KV)
TRXCHUCK
Triaxial chuck
Triaxial chuck
The triaxial chuck will allow ultra-low current measurement down to fA when used with specific micropositioners with trixial arm and hermetic box for light and shield isolation.

- It is composed of 3 parts of which the middle part can be polarized,
- A high-temperature version is also available when associated with a hot or tri-temp chuck
- Available for wafers up to 300 mm (12")
- The triaxial chuck typically replaces the standard chuck onto a manual or semi-automatic prober to perform low level current measurement.

Our range of probers accept rectangular probecards, 4.5" wide, with a flat connector on one end
• Design and fabrication are made according to the die and test specifications
• Up to 256 channels with standard or coaxial isolation
• Some probecards can work at high frequencies
• Specific serie designed for high temperatures up to 300°C
• Production probecards for automatic probers available
Probecard
Probe card
Probe card
The probecards fullfill all production probing applications and particularly the highly demanding nowadays circuits : high pincount, ultra-fine pitch, multi-DUT testing, specific constraint (low-k, probe over active area....).

- Pcb design available for custom boards (all commercial testers)
- All services of specific design, manufacture, diagnostic and repair, alignment...
- Available for pads test or bumps tests
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171