The semi-automatic probers will allow the user to perform a complete testing on a partial or entire wafer, automatically and very repeatably
• A pattern recognition software (New) eliminate the false positioning by recognizing exactly where the tips need to land
• The stations are available in several configurations depending on the wafer size and automation needed
• High frequency RF models
• Control of motion by external GPIB or built in software
• Variety of accessories and options matching all specific applications, temperature measurements, FemtoAmp, high power...
• A perfect choice for die characterization, design validation, failure analysis and low-medium production (manual wafer loading)