PROBE TESTINGProbe stationsCompact thermal probe stations

HCP621G-MPGastight probe station

Mini test station for temperature and controlled atmosphere measurements.
This completely hermetic ultra-compact station offers you a wide range of possibilities. Rhenium tungsten tips manually manipulated and can be placed on studs >= 100µm.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip

Specifications:

• Measurements on unit samples
• Manual positioning 4 mobile spring-mounted prongs.
• Temperature range: -190°C to 600°C
• Injection of neutral gas (Argon, Nitrogen)

Comparison with -PM version:

For more sensitive application, the -MP has sliding probes which do not move during thermal expansion of the sample and thus do not scratch the sample electrodes whereas the -PM can scratch the pads. The -MP can also be upgraded to an -MPS later.

HCP-600-G-PMGastight probe station

HP-1000-V-PS-50Probe station under vacuum

Compact probing station for high temperature measurements under vacuum.
This completely hermetic station allows you to go up to 1000°C while putting your sample under vacuum.
Tungsten Rhenium tips, very resistant to high temperature and reliable. These tips can be manipulated manually thanks to micropositioners, which facilitates their precise placement on pads whose size is greater than or equal to 10 µm.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip

Specifications:

• Measurements on unit samples, 50x 50mm
• Manual positioning with 4 micropositioners (Up to 7 micropositioners)
• Temperature range: Ambient to 1000°C
• Vaccum chamber

HCP-400-V-PMMini probe stage under vacuum

Mini test station for temperature and vacuum measurements.
This completely hermetic ultra-compact station offers you a wide range of possibilities. Rhenium tungsten tips manually manipulated and can be placed on studs >= 100µm.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip

Specifications:

• Measurements on unit samples, size 28x30 mm
• Manual positioning 4 mobile spring-mounted prongs.
• Temperature range: -190°C to 400°C
• Vacuum capability up to 1 mTorr

HCP421V-PMHNo-magnetic mini probe stage under vacuum

Mini test station for temperature measurements, under vacuum and non-magnetic.
This completely hermetic ultra-compact station offers you a wide range of possibilities. Rhenium tungsten tips manually manipulated and can be placed on studs >= 100µm. This non-magnetic station will allow you to perform measurements with Helmholtz coils.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip
-Test under magnetic fields

Specifications:

• Station for performing vacuum measurements inside a Helmholtz coil system
• Dimensions of the station 180 mm x 130 mm x 26.5 mm
• Measurements on unit samples, size 38x42 mm
• Manual positioning 4 mobile spring-mounted prongs
• Temperature range: -190°C to 400°C
• Vacuum-tight chamber

HCP421V-MPSMini probe stage under vacuum

Mini test station designed specifically to perform temperature and vacuum measurements.
This station is fully sealed, allowing it to provide a controlled and stable measurement environment. Thanks to this station, you benefit from a wide range of possibilities for your experiments.
The tips used in this station are made of tungsten rhenium, which makes them very resistant and reliable. These tips can be manipulated using micropositioners, which facilitates their precise placement on pads whose size is greater than or equal to 10 µm.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip

Specifications:

• Measurements on unit samples, size 28x30 mm
• Manual positioning with 4 micropositioners (Up to 7 micropositioners)
• Temperature range: -190°C to 400°C
• Vacuum capability up to 1 mTorr

ABOUT OUR Compact thermal probe stations

Equipment allowing the test under probes in temperature and under controlled environment for sample of 100 mm (4") maximum. This equipment is perfectly adapted to the research laboratory, university or small production. This system will allow you to make I/V measurements while controlling the environment in which the sample is located, in particular to avoid corrosion and oxidation during periods of temperature rise.
We propose two methods, one by injection of neutral gas and the other by aspiring all the air contained in the vacuum chamber.

Equipments:

• HCP-400-V-PM: Temperature range: -190 to 400°C - tips mounted on springs - under vacuum.
• HCP-400-V-MPS: Temperature range: -190 to 400°C - 4 micropositioners - under vacuum.
• HCP-600-G-MPS: Temperature range: -190 to 600°C - 4 micropositioners - gas injection.
• HP-1000-V-PM: Temperature range: Ambient to 1000°C - tips mounted on springs - under vacuum.

Specifications:

• Variable temperature from 80K to 873k (-190°C to 1000°C)
• Injection of neutral gas (Argon, Nitrogen)
• Vacuum capability to control humidity, condensation and oxidation (up to 8.10−3 Torr)
• External control possible (GPIB, Ethernet, USB)
• Custom software on request
• Rhenium tungsten tips

For technical and commercial information, quote, ordering or request of visit by our representative.
+33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171