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IV / CV Measurements & Failure analysis

These boxes are used to isolate the component under test of external disturbances such as light or magnetic radiations during probing analysis
• Size, configuration and connections are customized per application
• The biggest model contains the entire test station while the basic model is more like suitcase-type 
• Dark box or Faraday cage depending on the application and filtering needed​
H1xx
Manual economical probe station
Manual economical probe station
Economical probe station available in 4 models for wafers up to 100 mm.

- Quick platen lift
- Up to 6 micropositioners and a probecard

MOST POPULAR REFERENCES

H-100 : Manual positioning of the chuck
H-120 : Manual positioning + X-Y knobs
H-150 : Precision chuck positioning by knobs
H-150W : RF special chuck version
S1160-x
General purpose probe station
General purpose probe station
The S1160 will support a broad range of precision probing applications including IV, CV, dies, wafers...
Modular, it can accept many options and accessories for multi-purpose (temperature, low current...) applications

- Quick platen lift allows contact / no contact
- Accept microscope (bino / trino)
- Accpet wafers up to 8'' (wafers 200mm)
- Angular wafer setup
- Allows up to 8 DC micropositioner or probe card
- Heavy body for better stability
CM170-WL170
High stability manual probe station
High stability manual probe station
From two model combination, the CM170/WL170 probe stations allows stability and accuraccy for moderate price.

- Large platen for frequency extender head use
- Multiple applications (optical, probecards, HF...)


MOST POPULAR REFERENCES

CM170 : DC to 100 MHz measurements
WL170 : DC to 110 GHz measurements
WL170-THz : mmW up to 1.1 THz (special raised chuck)
CM210-310
High accuracy manual probe station
High accuracy manual probe station
The Checkmate series represents the most accomplished probing stations, available for wafer up to 12".

- Upgradability from one version to another
- Manual or Semi-automatic version
- Test on Probecards available
- Optional thermal charactherization (-60°C to +300°C)
- High voltage (HV) and low current (fA) measurements possible
- Allows up to 8 DC micropositioners or probe card


MOST POPULAR REFERENCES

CM210 : Version 200 mm
CM310 : Version 300 mm
WL210E
8'' High accuracy manual probe station with local enclosure
8'' High accuracy manual probe station with local enclosure
This probe station is derivated of the Checkmate series. It includes an additional local chamber that allow temperature measurement (hot/cold) or very low current application

- fA measurements (low leakage)
- Light-tight environnement
- Electrical shielding
- Configuration : 4 HF port or 8 DC/Kelvin port or HF/DC combination
- 300mm version available
- Compatible with high performances ERS chuck (patented air cooling system, temperature from -60°C to +300°C)
PSM1000
The High Power Microscope
The High Power Microscope
High power microscope for fine inspection and high magnifications.
The PSM1000 is useful for precision contact on very small surfaces.


- It can be used as a stand alone or mounted onto Analytical probe station
- A range of accessories is available including a variety of objectives (polarizer, analyzer...)
- The trinocular head accepts a choice of digital cameras
- Spectroscopic applications available
SMZ168
Stereozoom microscope
Stereozoom microscope
Stereozoom microscope with trinocular head for probe tip placement.

- High working distance (WD = 113 mm)
- C-mount for digital camera
- Several objectives and eyepieces for wide range of magnification
MOTICAM5
Digital Camera
Digital Camera
Camera adaptable on all trinocular microscopes, useful for probe tips placing.

- Capture and measurement software supplied
MOTICAM1080P
Digital Camera
Digital Camera
Camera adaptable on all trinocular microscopes, useful for live positionning.

- Multi-output for live view on monitor
S750
Joystick micropositioner
Joystick micropositioner
This low cost micropositioner was developped for hybrids probing or general probing on 500 µm and larger pads.

- The joystick positioner S750 will accept standard probe holders model Ux.
- A large scan area is coupled with the adjustable Z movement
- The base is magnetic and the overall dimensions particularly low
- The spring probe clamp is isolated from the rest of the body while maintaining electrical conductance through a wire termination
- A model S750-1 with joystick extension is available for more precision of positioning
S725S-x
Micropositioner S725 serie with spring head
Micropositioner S725 serie with spring head
This micropositioner will allow landing on pads or lines down to 20µm.

- Spring head (for fragile surface or temperature), allows limiting the pressure of needles on the pads
S725P-x
Micropositioner S725 serie with pivot head
Micropositioner S725 serie with pivot head
This economic micropositioner will allow landing on pads or lines down to 20 µm.

- Pivot head (quick Z down before fine adjust, ideal for probe station)
S725HT-x
Micropositioner S725 high temperature
Micropositioner S725 high temperature
This economic micropositioner will allow probe tips to land on pads or lines down to 20 µm.

- Special model for temperature probe test measurement
S926P-x
Precision micropositioner S926 serie with pivot head
Precision micropositioner S926 serie with pivot head
This Precision positioner packaged in a small footprint allows placing probe tip on pads ou lines within accuracy of the micrometer.

- The Pivot head is perfect for a quick positioning in Z
- Other versions of the S926 offer Spring head (limiting needle pressure) or fixed head
SP100-x
High precision micropositioner SP100
High precision micropositioner SP100
High-precision micropositioner with inline controls knobs, the SP100 will allow easy landing on pads as well as internal lines within micron accuracy.

- The down Z movement of the tip is totally vertical
- The knobs with micrometric graduations (100TPI) allow an optimal density on the platen.
- Pivot head (Quick down Z for pre-positioning then fine movement) or Standard head with Z knob
SP150-xx
Ultra-stable submicronic micropositioner SP150
Ultra-stable submicronic micropositioner SP150
High-precision ultra-stable micropositioner with inline controls knobs, the SP150 will allow easy landing on pads as well as internal lines with a submicron accuracy.

- The down Z movement of the tip is totally vertical
- The knobs with micrometric graduations (100TPI) allow an optimal density on the platen.
- Standard head (down movement by the Z fine knob) or Pivot head for a quicker Z positioning
- The SP150 today represents the state-of-the-art in term of accuracy of positioning
UP
Standard Probe holder with spring lock
Standard Probe holder with spring lock
The probe holder accept all types of probe tips with diameter up to 0.6 mm, the tip is held onto the holder by spring.
UxTB
Coaxial Probe holder with teflon isolation
Coaxial Probe holder with teflon isolation
Specifically designed for low noise measurements, the coaxial probe holder allows probing at low leakage
UxGB
Coaxial Probe holder with ceramic isolation
Coaxial Probe holder with ceramic isolation
Specifically designed for low noise measurements, the coaxial probe holder allows probing at low leakage.
UxCB
Coaxial Probe holder with delrin isolation
Coaxial Probe holder with delrin isolation
Specifically designed for low noise measurements, the coaxial probe holder allows probing at low leakage.
TAF-XX
Passive antivibration table
Passive antivibration table
The 4 air pads efficiently filter the mechanical noise from the ground or neighbourhood for an ultra fine probe analysis, inspection or assembly.

- Platen available in several dimensions upon size and weight of the equipment
- Marble thickness is selected in function of the equipment seated on
- Faebi pads with air filling using compressor or bike pump (air line not needed)
- Several options (wheel, LCD stand, keyboard stand, rack, dark boxes capably...)
TAB-XX
Active antivibration table
Active antivibration table
The table allows pneumatic filtering of vibrations, the 4 dampers efficiently filter the mechanical noise from the ground or neighbourhood for an ultra fine probe analysis, inspection or assembly.

- Platens available in several dimensions upon size and weight of the equipment
- Individually adjustable air pressure sensors at each corner
MW-D3
Dark box with chuck
Dark box with chuck
This small probe station has been designed for high themperature application, it includes a chuck (ambient or hot chuck) and a circular platen that allow several magnetic micropositioner.

- A microscope can be used to contact small pads
- An economical solution for a variety of probing applications

Ezlaze
De-passivation laser
De-passivation laser
Laser specifically adapted to failure analysis on semiconductor devices.

- 4 wavelengths available : 1064nm, 532, 355, 266 depending on the layer nature
- Control of the shoot on 3 axis
- High precision of beam positioning and shooting
- 3 modes of operation  1 shoot / continous / pulsed


Quicklaze
High-power laser
High-power laser
Specific high power laser designed for failure analysis on semiconductor devices.

- 4 wavelengths available : 1064nm, 532, 355, 266 depending the the layer nature
- Identical to model Ezlaze with faster shooting cadence
- Cooling by water


CM-BMC
Board mount chuck
Board mount chuck
This PCB board holder permit to fix electronic board already mounted with components on a probe station.

PTG20-XX
Tungten Probe Tip
Tungten Probe Tip
General purpose probe tip sharpened at one extremity, the body material (Tungsten) is strong enough to be bent into a variety of shapes.

• The standard application is probing on pads and/or internal lines
• Material Tungsten, length 38 mm, tip radius from 0,5µm to 100µm
• Nickel-plated option is available for body only (easy soldering), please add the suffix ''N'' to the P/N
PTG4-XX
Probe Tip with Tungsten Wire
Probe Tip with Tungsten Wire
The wire-tip combines a rigid body with a thin Tungsten wire of various diameters, the probe tip is then soft enough to avoid damaging the probing pad materials.

• Length of body 51 mm, Tungsten wire 3 to 5 mm
• Body diameter 0.51 mm, wire 5 to 125 microns
• Tip radius 0.1 to 5 microns
• Most popular references : PTG410, PTG422, PTG435, PTG4135
• Download the full list below for more information
MW-SCA250
Coaxial true-Kelvin low-signal-level probe
Coaxial true-Kelvin low-signal-level probe
The Kelvin Coaxial Probes are designed for low-level signal probing in high-current applications. The single unit design is especially desirable for the best possible electrical characteristics and improbes tip control over conventional dual tips design

• The Probes are constructed of microwave-quality components
• The 50 ohm semi-rigid cable consists of 8 mil tungsten wire forming the inner conductor and probe point, with isolation from the gold plated copper shield being achieved through the utilization a Teflon dielectric
• The probe contact protrudes from the shielding by .150" (3mm) to maintain low-level signal noise to the probTips available (replaceable) from 0.5µm to 12.5µm
• Standard SSMC connector etamp; Series /parallel resistor configurations available in option
MWPA-7
Active probe model 7
Active probe model 7
The model 7 is designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes.

• A flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms avoids undesirable reflections
• A special miniature connector receives replacement coaxial probe tips providing a shielded environment to within 3 mm of the fine tungsten probe point
• Other models : 7, 7A. For every posiitonner (please specify the model)
• For temperature applications up to 200°C, the models MWPA-7-HT and MWPA7A-HT are available
MWPA-12C
Active probe 12C
Active probe 12C
Active probe tip for characterization on internal nodes requiring a low input capacitance

• The active arm has specific mounting to the micropositioner (specify when ordering)
• A separate power supply provides power to the probes (up to 2 per power supply), ref. MW-PS2
• Frequency range DC to 500 MHz
• The replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
• See the range of replaceable probes tips MWPA-R12C
• Other models : 7, 7A, 18C, 19C, 28, 29, 34A, 35...
MWPA-18C
Active probe 18C
Active probe 18C
Active probe tip for characterization on internal nodes requiring a low input capacitance

• The active arm has specific mounting to the micropositioner (specify when ordering)
• A separate power supply provides power to the probes (up to 2 per power supply)
• The supplied replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
• See the range of replaceable probes tips MWPA-R18C
• Other models : 7, 7A, 12C, 19C, 28, 29, 34A, 35...
MWPA-18CHV
Active probe 18CHV
Active probe 18CHV
Active probe tip for characterization on internal nodes requiring a low input capacitance

• The active arm has specific mounting to the micropositioner (specify when ordering)
• A separate power supply provides power to the probes (up to 2 per power supply), ref. MW-PS2
• Frequency range DC to 350 MHz
• High Voltage up to +15V
• The supplied replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
• See the range of replaceable probes tips MWPA-R12C
• Other models : 7, 7A, 12C, 19C, 28, 29, 34A, 35...
MWPA-28
Active probe 28
Active probe 28
Active probe tip for characterization on internal nodes requiring a low input capacitance

• The active arm has specific mounting to the micropositionner (specify when ordering)
• A separate power supply provides power to the probes (up to 2 per power supply), ref. MW-PS2
• Frequency range DC to 1 GHz
• The supplied replaceable probe tip includes a MOS at the input and mounts onto the active ar, several tip shank diameters and radius are available
• See the range of replaceable probe tips MWPA-R28
• Other models : 7, 7A, 12C, 18C, 19C, 29, 34A, 35
MWPA-34A
Active probe 34A
Active probe 34A
Active probe tip for characterization on internal nodes requiring a low input capacitance

• The active arm has specific mounting to the micropositioner (specify when ordering)
• A separate power supply provides power to the probes (up to 2 per power supply), ref. MW-PS2
• Frequency range DC to 500 MHz
• The supplied replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
• See the range of replaceable probes tips MWPA-R12C
• Other models : 7, 7A, 12C, 18C, 19C, 28, 29, 35...
MWPA-35
Active probe 35
Active probe 35
Active probe tip for characterization on internal nodes requiring a low input capacitance

• The active arm has specific mounting to the micropositioner (specify when ordering)
• A separate power supply provides power to the probes (up to 2 per power supply), ref. MW-PS3
• Frequency range DC to 26 GHz
• The replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
• See the range of replaceable probes tips MWPA-R12C
• Other models : 7, 7A, 12C, 18C, 19C, 28, 29, 34A
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171