LAYER CHARACTERIZATION - Non destructive measurement systems

The TF lab 2020 Series allows manual single point measurements of conductive thin films and layer thickness measurement of thin metal layers in non-contact mode.
The compact bench-top device is ideal for fast and accurate measurements of samples up to 200 x 200 mm² (8 x 8 inches).
In addition to the measurement of thin conductive layers also doped wafers and conductive polymers can be analyzed.

Applications :

- Coated architectural glass, e.g. LowE
- Displays, touch screens and flat panel displays
- OLED and LED applications
- Smart glass
- Graphene layers
- Photovoltaic wafers and cells
- Semiconductor wafers
- Metallization layers and wafer metallization
- De-icing and heating applications
- Battery electrodes
- Conductively coated paper and conductive textiles

The TF map 2525 Series auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 254 x 254 mm² (10 x 10 inches) in non-con­tact mode.
Upon manu­al sample po­s­i­tion­ing the device auto­mat­ic­ally meas­ures and dis­plays an ac­cur­ate map­ping of the sheet res­ist­ance across the en­tire sample area. The meas­ure­ment set­tings al­low eas­ily and flex­ibly to choose between fast meas­ure­ment times of be­low 1 minute or high spa­tial meas­ure­ment res­ol­u­tion of more than 1 000 000 meas­ure­ment points.

Advantages of this system :

- Non-contact
- Non-destructive
- Fast and precise measurement
- High-resolution mapping of conductive thin films
- Imaging substrates
- Defect detection and coating analysis
- Characterization even on hidden and encapsulated conductive layers
- Various software-integrated analysis functionse (e.g. sheet resistance distribution, line scans, single point analysis)
- Measurement data saving and export functions

The TF map 3030 Series auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 300 x 300 mm² (12 x 1é inches) in non-con­tact mode.
Upon manu­al sample po­s­i­tion­ing the device auto­mat­ic­ally meas­ures and dis­plays an ac­cur­ate map­ping of the sheet res­ist­ance across the en­tire sample area. The meas­ure­ment set­tings al­low eas­ily and flex­ibly to choose between fast meas­ure­ment times of be­low 1 minute or high spa­tial meas­ure­ment res­ol­u­tion of more than 1 000 000 meas­ure­ment points.

Advantages of this system :

- Non-contact
- Non-destructive
- Fast and precise measurement
- High-resolution mapping of conductive thin films
- Imaging substrates
- Defect detection and coating analysis
- Characterization even on hidden and encapsulated conductive layers
- Various software-integrated analysis functionse (e.g. sheet resistance distribution, line scans, single point analysis)
- Measurement data saving and export functions

The TF portable 1010 is a compact and portable system for measuring resistivity and sheet resistance over large areas. It allows to characterize large conductive layers by rapid contact. The system uses the Eddy current method. This method allows non destructive measurements to be made. It is possible to measure encapsulated samples and components. Eddy currents penetrate non-conductive layers such as surface oxides or any other coating.

The system is very usefull in production or in the field, for example for quick quality checks after manufacturing or as incoming good inspection.

It is an easy-to-use device that is controlled via a touch display.

Areas of application :

- Architectural Glass (LowE)
- Mirror coatings
- Reflective layers
- Packaging foils
- Electrode layers in smart / electrochromic glass and energy storage
- Battery electrodes
- Conductive paper and conductive textiles