TF series non-contact measurement systems contain a set of sensors that induce weak currents in conductive and semi-conductive layers. These induced currents, also called eddy currents, generate an electromagnetic field directly which is linked to the intrinsic parameters of the sample. Thus, we will be able to characterize its resistivity, its layer thickness, its anisotropy, its permeability, its permissivity, its weight or its emissivity without any mechanical contact.
By modulating the emission frequencies of the initial magnetic field, we will be able to control its depth of penetration and therefore the thickness of the layer that we wish to measure. It is therefore possible to perform measurements of one or more layers simultaneously on a wide range of materials such as metals, glasses, thin coating layers, conductive films, electrode layers, papers and textiles. conductors, or even polymers.
The technology is independent of surface characteristics or morphology. In addition, it does not require any type of contact or special preparation of the sample as for four-point tests, Hall effect or Van-der-Pauw measurements. The system does not require the placement of test structures and is unaffected by surface roughness, non-conductive encapsulations or passivation layers. Moreover, the measurement does not physically affect the thin film tested.
Eddy current instruments have a long life because they are free from any mechanical wear due to their non-contact nature. It also achieves high repeatability and high accuracies in an ultra-fast manner which ensures the quality of measurement of various thin layers.
Finally, these systems are often accompanied by a software part with various functions for recording and exporting data, thus allowing easy reading of the results in the form of a map, for example.
