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ApplicationTEST ON PACKAGED DEVICESProbing a packaged device

Probing a packaged device

A packaged device can be possibly tested under needles for failure analysis purposes. The die needs to be accessed by chemical etching or mechanical opening of the cover. A specific accessory is then needed to hold the device while testing with a probe station accepting the specific holder. Microworld offers the global solution.
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H1xx
Manual economical probe station
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Manual economical probe station
Economical probe station available in 4 models for wafers up to 100 mm.

- Quick platen lift
- Up to 6 micropositioners and a probecard

MOST POPULAR REFERENCES

H-100 : Manual positioning of the chuck
H-120 : Manual positioning + X-Y knobs
H-150 : Precision chuck positioning by knobs
H-150W : RF special chuck version
S1160-x
General purpose probe station
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General purpose probe station
The S1160 will support a broad range of precision probing applications including IV, CV, dies, wafers...
Modular, it can accept many options and accessories for multi-purpose (temperature, low current...) applications

- Quick platen lift allows contact / no contact
- Accept microscope (bino / trino)
- Accpet wafers up to 8'' (wafers 200mm)
- Angular wafer setup
- Allows up to 8 DC micropositioner or probe card
- Heavy body for better stability
SMZ168
Stereozoom microscope
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Stereozoom microscope
Stereozoom microscope with trinocular head for probe tip placement.

- High working distance (WD = 113 mm)
- C-mount for digital camera
- Several objectives and eyepieces for wide range of magnification
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617
Products Categories

PROBE STATIONS

ACCESSORIES FOR PROBE STATIONS

TEST PROBES

EQUIPMENT FOR THIN LAYER CHARACTERIZATION

PRODUCTS FOR COMPONENTS TESTÌNG AND BURN IN

EQUIPMENT FOR DICING AND RELATED PROCESSES

CONSUMABLE FOR DICING PROCESSES

Applications

CHARACTERIZATION OF ELECTRONIC LAYERS

INSTRUMENTATION CONTROL

ELECTRICAL TESTS UNDER NEEDLES

TEST ON PACKAGED DEVICES

DICING OF SUBSTRATES

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171