NEW ! Thermal forcing system providing hot and cold temperature
Our Test and burn-in Sockets accommodate ALL packages, Standard or Custom
NEW : Ovens and burn in chamber for bringing temperatures on devices or sub-assemblies

Probing a packaged device

Equipment and materials for electrical characterization of thin semiconductive layers. The four-point-probe technic, Hall effect or Mercury probing allow measuring and monitoring the layers response to electrical stimuli and determine the devices functionality.
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171