Paul has recently joined our Sales Team as Semiconductor materials and technology specialist, please welcome him on-board
Some New products arriving soon : Thermal conditioning systems for temperature characterisation, 4-Point-Probe with Evolutive customised software…
Next shows events : ERMS Nice France 27-31 September, EuMW European Microwave Week Paris France 1-3 October
Set of equipment's for measuring the sheet resistivity of thin layers in ohm/square or ohm.cm, manual or automatic positioning, mapping • Manual basic models, or more with control and mesurement software, portable systems • Semi-automatic range for wafers up to 300 mm with mapping • Choice of Four Point Probe heads • Temperature option
4 point probe stand
S302
4 point probe stand

The base configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 4 inches, the sample positioning is manual as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4-point probe headThe measurement itself is provided from an external sourcemeter and voltmeter typica...

4 point probe manual-evolutive measurement system
PRO4
4 point probe manual-evolutive measurement system

Manual sheet resistivity measurement systems for laboratory and Retamp;amp;D applications, manual sample positionning as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4 needlesThe measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family (supplied upon version)The sy...

Semi-automatic 4 point probe measurement system
280I
Semi-automatic 4 point probe measurement system

Measurement range 1 mohm to 8E11 ohm/square, manual (1pt, 5pts) or semi-automatic with analysis and mapping up to 6000 points upon model. Standard measurements range, optional extended range, data storage and retrieval, powerfull search functions in the dataresults baseMapping patterns polar or cartesian up to 650 points, diameter scan, custom patterns, wafer edge correctionAutomatic detection o...

Semi-automatic 4 point probe measurement system
QUADPRO
Semi-automatic 4 point probe measurement system

This system is derivated from the PRO4 system into a semi-automatic version (or manual) and an extended resisitvity range, low and high Res (up to 10G ohm/sq). • A thermal controller and a software allow the TCR coefficient gestion Suited for laboratory research on semiconductor materials ...

SRM - Hand-held 4 point probe system
SRM232-XX
SRM - Hand-held 4 point probe system

The hand-held resistivity system allows measurement on several materials of variable size, supplied with battery powering, it can be used everywhere in the field. 4 models/measurement ranges available with the adapted Cal fixtureInter-changeable four point probe headApplications : Conductivity/resistivity on large heavy coated panels, aircrafts paint, cars...Or quality control at suppliers site....

Calibration wafer
SRS3
Calibration wafer

This NIST wafer is used to calibrate 4PP systems NIST certification during 1 year...

Measure the sheet resistivity by 4-Point-Probe method on large surface thanks to a mobile probe head • Plusieurs gammes de résistivité selon couches à mesurer • Different ranges of resistivity according to layers • Calibrators subtrates available • Probe tips are seated on spring for a measurement by pressure
SRM - Hand-held 4 point probe system
SRM232-XX
SRM - Hand-held 4 point probe system

The hand-held resistivity system allows measurement on several materials of variable size, supplied with battery powering, it can be used everywhere in the field. 4 models/measurement ranges available with the adapted Cal fixtureInter-changeable four point probe headApplications : Conductivity/resistivity on large heavy coated panels, aircrafts paint, cars...Or quality control at suppliers site....

Calibration substrates used for verification and fine adjustment of four-point-probe systems, available in wafer of different resistivity values
Calibration wafer
SRS3
Calibration wafer

This NIST wafer is used to calibrate 4PP systems NIST certification during 1 year...

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171