LAYER CHARACTERIZATIONMaterial analysis systemsOptical profilometers

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Standard optical profilometer

ST400Standard optical profilometer

Designed with Chromatic Light Technology, the ST400 Optical Profiler measures physical wavelengths and delivers the highest accuracy on any surface roughness, shape, and material. Transparent or opaque.

Movement on the X-Y axes of 200 x 150 mm with speeds of up to 40 mm/s. Provides fast measurements on a wide range of samples with varying geometries. No image sticking!

The advanced software makes it easy to select which areas of the screen will be scanned automatically. Quality control options are available to automate all aspects of testing, including pattern recognition, database communication, macros and analysis recipes.

Benefits:

- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers
Compact optical profilometer

PS50Compact optical profilometer

Designed with Chromatic Light technology, which measures wavelengths, PS50 offers the highest precision on all roughnesses, all shapes and all materials. Transparent or opaque.

Thanks to a displacement of 50 x 50 mm on the X-Y axes, this portable optical profilometer allows high-speed measurements and does not require gluing of images.

A compact unit with high speed sensor is truly a gateway to the frontier of profilometry.

Benefits:

- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers
High speed optical profilometer

Jr100High speed optical profilometer

Designed with Chromatic Light technology, which measures physical wavelength, Jr100 Profiler delivers the highest accuracy on all roughnesses, shapes and materials. Transparent or opaque.

Thanks to a travel of 100 x 100 mm on the X-Y axes, this portable optical profilometer allows high-speed measurements and does not require image sticking. With its small footprint and weight of only 17 kg, the JR100 can be transported easily to any location.

A portable unit with a high-speed sensor is truly a gateway to the frontier of profilometry.

Benefits:

- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers
Portable optical profilometer

Jr25Portable optical profilometer

Designed with Chromatic Light technology, which measures physical wavelengths, Jr25 Profiler offers the highest precision on all roughnesses, all shapes and all materials. Transparent or opaque.

With a fully rotating drive head, compact design and complete portability, no surface is out of reach. This portable profilometer opens the door to research and quality control testing in complex environments that were beyond the reach of previous generations of instruments.

Lab instrument performance now available as a carry-on.

Benefits:

- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers
ABOUT OUR Optical profilometers
Our non-contact 3D optical profilometers are based on the Confocal Chromatic technique which uses wavelengths of light to accurately determine physical height. Take advantage of a wide range of models including compact, stand-alone and portable profilometers. High-speed line sensors are available to scan large areas with high accuracy.
A single sweep of the profilometer provides access to multiple material surface parameters such as 3D waviness, roughness, step height, film thickness and even advanced fractal analysis or particle characterization.
Chromatic confocal technology uses white light that passes through a series of lenses with a high degree of chromatic aberration. Each wavelength focuses at a different distance, creating the vertical measurement range. When a surface of interest is within this range, only one wavelength of white light is focused, while all others are out of focus. Only the focused wavelength passes through the hole filter to reach the CCD spectrometer. The measured physical wavelength corresponds to a vertical position.

Equipments:

• Jr25: Portable system
• Jr100: Ultra-fast system
• PS50: Compact system
• ST500: Large area system
• ST400: Standard system

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171