ApplicationELECTRICAL TESTS UNDER NEEDLESHigh Power Probing

High Power Probing

Specifically needed for certain devices within the automotive applications and others, the High-Power-Probing option is available on our probing stations of the model WL350, WL210e, WL370
The Voltage-Current attainable is : From 3kV triax to 10kV coax, 10A DC to 450A pulsed
• Specific anti-arcing solution
• Special High-Current (Kelvin) and High-Voltage probe tips (Triax or Coax)
NEED MORE INFORMATION ?
HVP
High voltage probe holder
  Voir la Fiche Produit
High voltage probe holder
This probe holder series allow high voltage measurements, up to 20KV.

Tip holding by spindle or by screw.
Useful for IV measurements on HV transistors and HV diodes.
PSM1000
Turret microscope
  Voir la Fiche Produit
Turret microscope
Turret microscope for fine inspection and high magnifications.
The PSM1000 is useful for precision contact on very small surfaces.

- It can be used as a stand alone or mounted onto analytical probe station
- A range of accessories is available including a variety of objectives (NIR, NUV, polarizer, analyzer...)
- The trinocular head accepts a choice of digital cameras
- Spectroscopic applications available
SP100
High precision micropositioner SP100
  Voir la Fiche Produit
High precision micropositioner SP100
High-precision micropositioner with inline controls knobs, the SP100 will allow easy landing on pads as well as internal lines within micron accuracy.

- The down Z movement of the tip is totally vertical.
- The knobs with micrometric graduations (100TPI) allow an optimal density on the platen.
- Pivot head (Quick down Z for pre-positioning then fine movement) or Standard head with Z knob.
SP150
Ultra-stable submicronic micropositioner SP150
  Voir la Fiche Produit
Ultra-stable submicronic micropositioner SP150
High-precision ultra-stable micropositioner with inline controls knobs, the SP150 will allow easy landing on pads as well as internal lines with a submicron accuracy.

- The down Z movement of the tip is totally vertical.
- The knobs with micrometric graduations (100TPI) allow an optimal density on the platen.
- Standard head (down movement by the Z fine knob) or Pivot head for a quicker Z positioning.
- The SP150 today represents the state-of-the-art in term of accuracy of positioning.
HPCHUCK
High power chuck
  Voir la Fiche Produit
High power chuck
The high power chuck has been designed for use when probing at high voltage or high current.

- 150, 200 or 300 mm size available
- For very high voltage measurement (10KV)
MWPHC
High Current Probe
  Voir la Fiche Produit
High Current Probe
The Kelvin-capable HCP high current probe is the only probe design on this type in the industry today. The multi-probe design distributes current among the contact points and heat sink remove heat from probe-pad interface to prevent overheating. The unique design gives the user the ability to have Kelvin access to device at the pad level.

- Specs PowerPro 3kV triax / 10kV coax, 450A pulsed / 10A DC
- Tungsten probes, ceramic body for high temperature use
- Mounting on RF positioner
- Complementary to our PowerPro probe systems
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617
Products Categories

LAYER CHARACTERIZATION

COMPONENTS TESTÌNG AND BURN IN

BACK-END PROCESSING

PROBE TESTING

Applications

CHARACTERIZATION OF ELECTRONIC LAYERS

INSTRUMENTATION CONTROL

ELECTRICAL TESTS UNDER NEEDLES

TEST ON PACKAGED DEVICES

DICING OF SUBSTRATES

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171