Microworld presents a range of product for Microwave components Probing and Testing. The range includes Probe stations, RF Probe tips and various accessories.
• The Probe stations are designed to accept all type of wafer/substrate and are evolutive. They include one or two CAL substrate holder.
• Test frequencies >500Ghz
• Probe tips specific for RF testing are coplanar type or waveguide
• Optional "Wedge Cards" allow mixing various needles RF, DC for an easier set-up