Paul has recently joined our Sales Team as Semiconductor materials and technology specialist, please welcome him on-board

Our Products family N°1 : Equipment’s and accessories for semiconductor materials electrical characterization

Some New products arriving soon : Thermal conditioning systems for temperature characterisation, 4-Point-Probe with Evolutive customised software…

Next shows events : ERMS Nice France 27-31 September, EuMW European Microwave Week Paris France 1-3 October

ApplicationCHARACTERIZATION OF ELECTRONIC LAYERS Mercury contact probing

Mercury contact probing

Value for low K & High K

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CVM92M

Manual mercury C-V system

C-V manual mercury characterization tool for wafer and substrate up to 200 mm Manual loading of the sample, automatic measurementThe CV92M allows Measuring & Charactérizing & Monitoring a number of parameters on semiconductors materials including the process monitoring. ...

TAF-XX

Passive antivibration table

Dimensions : Upon demand
Use : Probe station, AFM, Microscopy
Feet : Height adjustable

The 4 air pads efficiently filter the mechanical noise from the ground or neighbourhood for an ultra fine probe analysis, inspection or assembly. Platen available in several dimensions upon size and weight of the equipmentMarble thickness is selected in function of the equipment seated onFaebi pads with air filling using compressor or bike pump (air line not needed)Several options (wheel, LCD sta...

(traduction manquante)

NEED MORE INFORMATION ?

CVM92M

Manual mercury C-V system

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

Products Categories

PROBE STATIONS

ACCESSORIES FOR PROBE STATIONS

TEST PROBES

EQUIPMENT FOR THIN LAYER CHARACTERIZATION

PRODUCTS FOR COMPONENTS TESTÌNG AND BURN IN

EQUIPMENT FOR DICING AND RELATED PROCESSES