Hall Effect Measurements and other parameters

The Hall Effect Measurements Systems allow measuring and monitoring a number of significant parameters of semiconductive layers by applying Van Der Pauw law.
• Resistivity
• Mobility
• Carrier concentration
• Hall Effect Coefficient
HMS3000
Manual Hall Effect measurement system
Manual Hall Effect measurement system
The HMS3000 measures parameters using Van Der Pauw method : resistivity, mobility, carrier concentration, hall effect... with constant current source and permanent magnets, the system provides an access to the true characterization of semiconductors layers, compounds, solar cells...

Included :

- Choice of magnet modul : 0.55T and 1T (variable magnet possible)
- Easy clip sample holder of 5*5mm to 25x25 mm
- Measurement at two temperatures, ambient (room t°) and 77K

The HMS3000 includes software with I-V curve capability for checking the ohmic integrity of the user made sample contacts. The systems can be used to characterize various materials including semiconductors and compound semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, DaAs, InGaAs, InP, GaN, ZnO, TCOs, metals, etc., at both 300K and 77K (room temperature and liquid nitrogen temperature).
HMS5000
Temperature Hall Effect measurement system (semi-automatic)
Temperature Hall Effect measurement system (semi-automatic)
The HMS5000 model is aimed to characterize a variety of semiconductor layers accessible by needles.
It measures parameters using Van Der Pauw method : resistivity, mobility, carrier concentration, hall effect... with constant current source and permanent magnets
The system provides an access to the true characterization of semiconductors layers, compounds, solar cells...


The typical configuration includes :

- Magnet modul : 0.55T
- Easy clip holder and contact on the sample under test
- Temperature ranging

The HMS5000 includes software with I-V curve capability for checking the ohmic integrity of the user made sample contacts. The systems can be used to characterize various materials including semiconductors and compound semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, DaAs, InGaAs, InP, GaN, ZnO, TCOs, metals, etc., at both 350K and 77K (liquid nitrogen temperature).
HMS5300
High temperature Hall Effect measurement system (semi-automatic)
High temperature Hall Effect measurement system (semi-automatic)
The HMS5300 comes as a complement for the users of HM5000 allowing a higher temperature range.

- It measures semiconductor parameters using Van Der Pauw method : resistivity, mobility, carrier concentration, hall effect... with constant current source
- 0.55T magnet
- Easy clip sample holder for sample sizes of 5*5mm to 25*25mm
- Measurement from 77K to 570K

The HMS5300 includes software with I-V curve capability for checking the ohmic integrity of the user made sample contacts. The systems can be used to characterize various materials including semiconductors and compound semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, DaAs, InGaAs, InP, GaN, ZnO, TCOs, metals...
HMS5500
Very high temperature Hall Effect measurement system (semi-automatic)
Very high temperature Hall Effect measurement system (semi-automatic)
The HMS5500 comes as a complement for the users of HM5000 adding the capability of a much higher temperature range.
It measures parameters using Van Der Pauw method : resistivity, mobility, carrier concentration, hall effect... with constant current source

- 0.55T magnet
- Easy clip sample holder for sample sizes of 5*5mm to 25*25mm
- Temperature measurement 77K to 770K

The HMS5500 includes software with I-V curve capability for checking the ohmic integrity of the user made sample contacts. The systems can be used to characterize various materials including semiconductors and compound semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, DaAs, InGaAs, InP, GaN, ZnO, TCOs, metals, etc...
HMS7000
Photonic Hall Effect measurement system with temperature
Photonic Hall Effect measurement system with temperature
Photonic hall effect measurement is aimed to measure various electrical properties of semiconductors layers by illuminating the sample within different range of wavelengths in addition to flowing current and applying magnet field strength.
It uses Van Der Pauw measurement method and offers capability of characterization on semiconductors, compounds, solar cells...

It includes :

- Software for I-R, R-V curves,
- 0.55T Permanent magnet
- Sample fixing by easy and fast clip system
- Temperature management
- RGB illumination
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171