Ambient 4-point probe head, useable on Pro4 serie and in-house stand. Tips material is function of the electronic layer under measureVariety of spacing, tip materials and radius, needle pressureTermination with flying wires or Banana jacks or BNC or triax cables or 9-Pins connector... ...
High-Temperature 4-point probe head, useable on Pro4 serie and in-house stand. Tips material upon type of electronic layer under measureVariety of spacing, tip materials and radius, needle pressureConnections : Flying wires, Banana Jacks, Triax, 9-Pins connector...Optional High-Resistivity shielding ...
4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...
4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...
The base configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 4 inches, the sample positioning is manual as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4-point probe headThe measurement itself is provided from an external sourcemeter and voltmeter typica...
Manual sheet resistivity measurement systems for laboratory and Retamp;amp;D applications, manual sample positionning as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4 needlesThe measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family (supplied upon version)The sy...
Measurement range 1 mohm to 8E11 ohm/square, manual (1pt, 5pts) or semi-automatic with analysis and mapping up to 6000 points upon model. Standard measurements range, optional extended range, data storage and retrieval, powerfull search functions in the dataresults baseMapping patterns polar or cartesian up to 650 points, diameter scan, custom patterns, wafer edge correctionAutomatic detection o...
This system is derivated from the PRO4 system into a semi-automatic version (or manual) and an extended resisitvity range, low and high Res (up to 10G ohm/sq). • A thermal controller and a software allow the TCR coefficient gestion Suited for laboratory research on semiconductor materials ...
The hand-held resistivity system allows measurement on several materials of variable size, supplied with battery powering, it can be used everywhere in the field. 4 models/measurement ranges available with the adapted Cal fixtureInter-changeable four point probe headApplications : Conductivity/resistivity on large heavy coated panels, aircrafts paint, cars...Or quality control at suppliers site....
This NIST wafer is used to calibrate 4PP systems NIST certification during 1 year...
Ambient 4-point probe head, useable on Pro4 serie and in-house stand. Tips material is function of the electronic layer under measureVariety of spacing, tip materials and radius, needle pressureTermination with flying wires or Banana jacks or BNC or triax cables or 9-Pins connector... ...
4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...
The hand-held resistivity system allows measurement on several materials of variable size, supplied with battery powering, it can be used everywhere in the field. 4 models/measurement ranges available with the adapted Cal fixtureInter-changeable four point probe headApplications : Conductivity/resistivity on large heavy coated panels, aircrafts paint, cars...Or quality control at suppliers site....
Manual sheet resistivity measurement systems for laboratory and Retamp;amp;D applications, manual sample positionning as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4 needlesThe measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family (supplied upon version)The sy...
The base configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 4 inches, the sample positioning is manual as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4-point probe headThe measurement itself is provided from an external sourcemeter and voltmeter typica...
This NIST wafer is used to calibrate 4PP systems NIST certification during 1 year...
High-Temperature 4-point probe head, useable on Pro4 serie and in-house stand. Tips material upon type of electronic layer under measureVariety of spacing, tip materials and radius, needle pressureConnections : Flying wires, Banana Jacks, Triax, 9-Pins connector...Optional High-Resistivity shielding ...
4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...
Ambient 4-point probe head, useable on Pro4 serie and in-house stand. Tips material is function of the electronic layer under measureVariety of spacing, tip materials and radius, needle pressureTermination with flying wires or Banana jacks or BNC or triax cables or 9-Pins connector... ...
4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...
This system is derivated from the PRO4 system into a semi-automatic version (or manual) and an extended resisitvity range, low and high Res (up to 10G ohm/sq). • A thermal controller and a software allow the TCR coefficient gestion Suited for laboratory research on semiconductor materials ...
Measurement range 1 mohm to 8E11 ohm/square, manual (1pt, 5pts) or semi-automatic with analysis and mapping up to 6000 points upon model. Standard measurements range, optional extended range, data storage and retrieval, powerfull search functions in the dataresults baseMapping patterns polar or cartesian up to 650 points, diameter scan, custom patterns, wafer edge correctionAutomatic detection o...
This NIST wafer is used to calibrate 4PP systems NIST certification during 1 year...
High-Temperature 4-point probe head, useable on Pro4 serie and in-house stand. Tips material upon type of electronic layer under measureVariety of spacing, tip materials and radius, needle pressureConnections : Flying wires, Banana Jacks, Triax, 9-Pins connector...Optional High-Resistivity shielding ...
4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...
ACCESSORIES FOR PROBE STATIONS
EQUIPMENT FOR THIN LAYER CHARACTERIZATION
PRODUCTS FOR COMPONENTS TESTÌNG AND BURN IN
5 rue de la Verrerie
38120 Le Fontanil-Cornillon
Grenoble / France
Fax : +33(0) 476 757 484
RCS Grenoble B 381 001 171 - APE 4652Z
TVA FR 48 381 001 171