Paul has recently joined our Sales Team as Semiconductor materials and technology specialist, please welcome him on-board
Some New products arriving soon : Thermal conditioning systems for temperature characterisation, 4-Point-Probe with Evolutive customised software…
Next shows events : ERMS Nice France 27-31 September, EuMW European Microwave Week Paris France 1-3 October
The semi-automatic probers will allow the user to perform a complete testing on a partial or entire wafer, automatically and very repeatably • A pattern recognition software (New) eliminate the false positioning by recognizing exactly where the tips need to land • The stations are available in several configurations depending on the wafer size and automation needed • High frequency RF models  • Control of motion by external GPIB or built in software • Variety of accessories and options matching all specific applications, temperature measurements, FemtoAmp, high power... • A perfect choice for die characterization, design validation, failure analysis and low-medium production (manual wafer loading)
4 point probe head
SP4-xx
4 point probe head

Ambient 4-point probe head, useable on Pro4 serie and in-house stand. Tips material is function of the electronic layer under measureVariety of spacing, tip materials and radius, needle pressureTermination with flying wires or Banana jacks or BNC or triax cables or 9-Pins connector... ...

High Temperature 4-Point-Probe-Head
HT4-xx
High Temperature 4-Point-Probe-Head

High-Temperature 4-point probe head, useable on Pro4 serie and in-house stand. Tips material upon type of electronic layer under measureVariety of spacing, tip materials and radius, needle pressureConnections : Flying wires, Banana Jacks, Triax, 9-Pins connector...Optional High-Resistivity shielding ...

Cylindrical 4 point probe head
CP4J-X
Cylindrical 4 point probe head

4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...

Cylindrical 4 point probe head
CP4-xxx
Cylindrical 4 point probe head

4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...

4 point probe stand
S302
4 point probe stand

The base configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 4 inches, the sample positioning is manual as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4-point probe headThe measurement itself is provided from an external sourcemeter and voltmeter typica...

4 point probe manual-evolutive measurement system
PRO4
4 point probe manual-evolutive measurement system

Manual sheet resistivity measurement systems for laboratory and Retamp;amp;D applications, manual sample positionning as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4 needlesThe measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family (supplied upon version)The sy...

Semi-automatic 4 point probe measurement system
280I
Semi-automatic 4 point probe measurement system

Measurement range 1 mohm to 8E11 ohm/square, manual (1pt, 5pts) or semi-automatic with analysis and mapping up to 6000 points upon model. Standard measurements range, optional extended range, data storage and retrieval, powerfull search functions in the dataresults baseMapping patterns polar or cartesian up to 650 points, diameter scan, custom patterns, wafer edge correctionAutomatic detection o...

Semi-automatic 4 point probe measurement system
QUADPRO
Semi-automatic 4 point probe measurement system

This system is derivated from the PRO4 system into a semi-automatic version (or manual) and an extended resisitvity range, low and high Res (up to 10G ohm/sq). • A thermal controller and a software allow the TCR coefficient gestion Suited for laboratory research on semiconductor materials ...

SRM - Hand-held 4 point probe system
SRM232-XX
SRM - Hand-held 4 point probe system

The hand-held resistivity system allows measurement on several materials of variable size, supplied with battery powering, it can be used everywhere in the field. 4 models/measurement ranges available with the adapted Cal fixtureInter-changeable four point probe headApplications : Conductivity/resistivity on large heavy coated panels, aircrafts paint, cars...Or quality control at suppliers site....

Calibration wafer
SRS3
Calibration wafer

This NIST wafer is used to calibrate 4PP systems NIST certification during 1 year...

(traduction manquante)
4 point probe head
SP4-xx
4 point probe head

Ambient 4-point probe head, useable on Pro4 serie and in-house stand. Tips material is function of the electronic layer under measureVariety of spacing, tip materials and radius, needle pressureTermination with flying wires or Banana jacks or BNC or triax cables or 9-Pins connector... ...

Cylindrical 4 point probe head
CP4J-X
Cylindrical 4 point probe head

4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...

SRM - Hand-held 4 point probe system
SRM232-XX
SRM - Hand-held 4 point probe system

The hand-held resistivity system allows measurement on several materials of variable size, supplied with battery powering, it can be used everywhere in the field. 4 models/measurement ranges available with the adapted Cal fixtureInter-changeable four point probe headApplications : Conductivity/resistivity on large heavy coated panels, aircrafts paint, cars...Or quality control at suppliers site....

4 point probe manual-evolutive measurement system
PRO4
4 point probe manual-evolutive measurement system

Manual sheet resistivity measurement systems for laboratory and Retamp;amp;D applications, manual sample positionning as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4 needlesThe measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family (supplied upon version)The sy...

4 point probe stand
S302
4 point probe stand

The base configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 4 inches, the sample positioning is manual as well as the contact of the tips by a rotating lever. A micro-switch insures that the current will be injected only after contact of the 4-point probe headThe measurement itself is provided from an external sourcemeter and voltmeter typica...

Calibration wafer
SRS3
Calibration wafer

This NIST wafer is used to calibrate 4PP systems NIST certification during 1 year...

High Temperature 4-Point-Probe-Head
HT4-xx
High Temperature 4-Point-Probe-Head

High-Temperature 4-point probe head, useable on Pro4 serie and in-house stand. Tips material upon type of electronic layer under measureVariety of spacing, tip materials and radius, needle pressureConnections : Flying wires, Banana Jacks, Triax, 9-Pins connector...Optional High-Resistivity shielding ...

Cylindrical 4 point probe head
CP4-xxx
Cylindrical 4 point probe head

4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...

(traduction manquante)
4 point probe head
SP4-xx
4 point probe head

Ambient 4-point probe head, useable on Pro4 serie and in-house stand. Tips material is function of the electronic layer under measureVariety of spacing, tip materials and radius, needle pressureTermination with flying wires or Banana jacks or BNC or triax cables or 9-Pins connector... ...

Cylindrical 4 point probe head
CP4J-X
Cylindrical 4 point probe head

4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...

Semi-automatic 4 point probe measurement system
QUADPRO
Semi-automatic 4 point probe measurement system

This system is derivated from the PRO4 system into a semi-automatic version (or manual) and an extended resisitvity range, low and high Res (up to 10G ohm/sq). • A thermal controller and a software allow the TCR coefficient gestion Suited for laboratory research on semiconductor materials ...

Semi-automatic 4 point probe measurement system
280I
Semi-automatic 4 point probe measurement system

Measurement range 1 mohm to 8E11 ohm/square, manual (1pt, 5pts) or semi-automatic with analysis and mapping up to 6000 points upon model. Standard measurements range, optional extended range, data storage and retrieval, powerfull search functions in the dataresults baseMapping patterns polar or cartesian up to 650 points, diameter scan, custom patterns, wafer edge correctionAutomatic detection o...

Calibration wafer
SRS3
Calibration wafer

This NIST wafer is used to calibrate 4PP systems NIST certification during 1 year...

High Temperature 4-Point-Probe-Head
HT4-xx
High Temperature 4-Point-Probe-Head

High-Temperature 4-point probe head, useable on Pro4 serie and in-house stand. Tips material upon type of electronic layer under measureVariety of spacing, tip materials and radius, needle pressureConnections : Flying wires, Banana Jacks, Triax, 9-Pins connector...Optional High-Resistivity shielding ...

Cylindrical 4 point probe head
CP4-xxx
Cylindrical 4 point probe head

4 point probe head for sheet resistivity measurements, usable on 280 serie and others or on in-house mounting assembly, ambient use only. Adjustable pressure on the probe headTip radius of different sizes adapted to most electronics layersTermination by 9-pins connector for direct plug inApplication at ambient temperature only ...

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171