Paul has recently joined our Sales Team as Semiconductor materials and technology specialist, please welcome him on-board
Our Products family N°1 : Equipment’s and accessories for semiconductor materials electrical characterization
Some New products arriving soon : Thermal conditioning systems for temperature characterisation, 4-Point-Probe with Evolutive customised software…
Next shows events : ERMS Nice France 27-31 September, EuMW European Microwave Week Paris France 1-3 October

ApplicationELECTRICAL TESTS UNDER NEEDLES Probing under Vacuum

Probing under Vacuum

The coplanar probes are designed for high frequencies RF microwaver probing up to 750GHz with various tips configurations • Configurations style GSG, GS, SG or dual GSGSG... • Low insertion loss • Individual contacts seated on springs allow a perfect contact on non totally flat surface • Pitch 50 micron to 1.2 mm • Wavelenght guide input on certain models • Calibration substrate for each specific configuration supplied separately
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Probing station under vacuum
ETCP2000
Probing station under vacuum

The model allows probing on a device while under vacuum for substrates wafers up to 4" Variable temperature from 80K to 573KVacuum down to 8 10-3 TorrAccepts up to 4 positioners ...
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617
Products Categories

PROBE STATIONS

ACCESSORIES FOR PROBE STATIONS

TEST PROBES

EQUIPMENT FOR THIN LAYER CHARACTERIZATION

PRODUCTS FOR COMPONENTS TESTÌNG AND BURN IN

EQUIPMENT FOR DICING AND RELATED PROCESSES

CONSUMABLE FOR DICING PROCESSES

Applications

CHARACTERIZATION OF ELECTRONIC LAYERS

INSTRUMENTATION CONTROL

ELECTRICAL TESTS UNDER NEEDLES

TEST ON PACKAGED DEVICES

DICING OF SUBSTRATES

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171