ELECTRICAL TESTS UNDER NEEDLESProbing under Vacuum

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Thermal tester

MW-TYLThermal tester

MW-TYL is a range of thermal testers made in France offering standard temperatures ranging from -70°C to 225°C.
It allows electronics and microelectronics manufacturers to perform thermal cycling tests (according to the MIL-STD-810H standard, for example).

We offer two models: a -30°C version (ranging from -30°C to 225°C) and a -70°C version (ranging from -70°C to 225°C).
The operating flow rate for both versions is 2.2 to 8.5 L/s continuous.
The front display is 7 inches and the head display is 4 inches.
External communication can be GPIB 488.2 or RS232.
Thermal chuck controller

S1080Thermal chuck controller

The trip-temp chuck and controller (ambient-hot-cold) ranges from -60°C to 300°C and allows a complete temperature characterization of devices, whether they are partial wafers or full wafers up to 12".

- The temperature parameters setting is by touch screen panel or remote control
- The transition time from hot to cold or reverse is one of the fastest on the market
- It is possible to program a ramp while heating up
ABOUT : Probing under Vacuum
Adapted to devices that need to be tested under needles and in vacuum environment, our products range will accept wafers up to 4" within a vaccum range down to 10-3 Torr.
• Positive and negative temperature testing included
• External positioners for pads accessing
• Custom Configuration possible
For technical and commercial information, quote, ordering or request of visit by our representative.
+33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171