ELECTRICAL TESTS UNDER NEEDLESProbing under Vacuum

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Thermal chuck controller

S1080Thermal chuck controller

The trip-temp chuck and controller (ambient-hot-cold) ranges from -60°C to +300°C and allows a complete temperature characterization of devices, whether they are partial wafers or full wafers up to 12".

- The temperature parameters setting is by touch screen panel or remote control
- The transition time from hot to cold or reverse is one of the fastest on the market
- It is possible to program a ramp while heating up
ABOUT : Probing under Vacuum
Adapted to devices that need to be tested under needles and in vacuum environment, our products range will accept wafers up to 4" within a vaccum range down to 10-3 Torr.
• Positive and negative temperature testing included
• External positioners for pads accessing
• Custom Configuration possible
For technical and commercial information, quote, ordering or request of visit by our representative.
+33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171