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ApplicationELECTRICAL TESTS UNDER NEEDLESProbing under Vacuum

Probing under Vacuum

Adapted to devices that need to be tested under needles and in vacuum environment, our products range will accept wafers up to 4" within a vaccum range down to 10-3 Torr.
• Positive and negative temperature testing included
• External positioners for pads accessing
• Custom Configuration possible
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For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617
Products Categories

PROBE STATIONS

ACCESSORIES FOR PROBE STATIONS

TEST PROBES

EQUIPMENT FOR THIN LAYER CHARACTERIZATION

PRODUCTS FOR COMPONENTS TESTÌNG AND BURN IN

EQUIPMENT FOR DICING AND RELATED PROCESSES

CONSUMABLE FOR DICING PROCESSES

Applications

CHARACTERIZATION OF ELECTRONIC LAYERS

INSTRUMENTATION CONTROL

ELECTRICAL TESTS UNDER NEEDLES

TEST ON PACKAGED DEVICES

DICING OF SUBSTRATES

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171