LAYER CHARACTERIZATIONFour point probe systemsFour point probe heads

SP44 point probe head

4-point head for ambient temperature, usable on equipment of the Pack4PP, Quadpro series and or for separate use. The standard head is designed in delrin with 4 independent tips in tungsten or osmium. A bayonet and two screws make it easy to attach the tip to our 4-prong stand for precise and repeatable measurements.

Specifications:

• Material of the tips defined according to application & type of layer
• Choice of parameters: Tip spacing (pitch), tip fineness, tip pressure
• Terminations: Flying leads, banana plugs, BNC, triaxial cables, 9-pin connector...

CP4Cylindrical 4 point probe head

4-point head for measuring resistivity, resistance, surface resistance or thickness. For use on 280 series equipment or separately, standard tip spacing is 1mm. The pressure is adjustable directly on the head.

Specifications:

• Adjustable pressure on the probe head
• Tip radius of different sizes adapted to most electronics layers
• Termination by 9-pins connector for direct plug in
• Application at ambient temperature only

HT4High temperature 4 point probe head

4-point head for high temperature and high resistivity, usable on equipment of the Pack4PP, Quadpro series and or for separate use. The standard head is designed in macor with 4 independent tips in tungsten or osmium. A bayonet and two screws make it easy to attach the tip to our 4-prong stand for precise and repeatable measurements.

Specifications:

• Material of the tips defined according to the type of layer to be measured
• Choice of parameters: Tip spacing (pitch), tip fineness, tip pressure
• Terminations: Flying leads, Banana jacks, Triax...

ABOUT OUR Four point probe heads

SP4 measuring heads have four in-line probe tips mounted on independent springs.
They make it possible to electrically characterize the resistance, the sheet resistance and the resistivity (thickness). Different models are available depending on the type of layer to be measured and the electrical properties.

Specifications:

• Different spacing between the tips: depends on the size of the sample (Edge effect)
• Choice of pressure applied: depending on the hardness of the material
• Two materials available: tungsten or osmium depending on electron affinities
• Several tip radius: depends of the thickness
• Wide choice of electrical connection: adapted to the measuring instrument
• High temperature model

Applications:

- Aeronautics
- Automotive
- Spatial
- Microelectronics
- Photovoltaic

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171