The purpose here is electrical characterization of electronic layers using different field-proven methods
• Test by needles and 4-Point-Probe method
• Van Der Pauw measurements for Hall effect and other parameters
• Mercury contact probe is particularly adapted for shallow and fragile layers and for specific materials (SOI…), special technics (Pseudo-Mos…) can be used

Amongst our applications for layers characterization, Microworld also propose the epitaxial growing by RTP (Rapid Thermal Process)
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171