CHARACTERIZATION OF ELECTRONIC LAYERS
A range of submicronic probe stations of high precision and accuracy for tests on small pads or very small internal nodes. Accepts from individual die to partial wafer or entire wafer up to 12"
• Solid base providing a low level of noise once seated on a vibration table
• Several configurations of chuck, standard, triax, thermally controlled...
• Can accept high-end positioners for an optimum accuracy
• Custom configurations upon specsheet