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CHARACTERIZATION OF ELECTRONIC LAYERS

The purpose here is electrical characterization of electronic layers using different field-proven methods
• Test by needles and 4-Point-Probe method
• Van Der Pauw measurements for Hall effect and other parameters
• Mercury contact probe is particularly adapted for shallow and fragile layers and for specific materials (SOI…), special technics (Pseudo-Mos…) can be used

Amongst our applications for layers characterization, Microworld also propose the epitaxial growing by RTP (Rapid Thermal Process)

Request information on : CHARACTERIZATION OF ELECTRONIC LAYERS

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For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171