NEW ! Thermal forcing system providing hot and cold temperature
Our Test and burn-in Sockets accommodate ALL packages, Standard or Custom
NEW : Ovens and burn in chamber for bringing temperatures on devices or sub-assemblies

CHARACTERIZATION OF ELECTRONIC LAYERS

A range of submicronic probe stations of high precision and accuracy for tests on small pads or very small internal nodes. Accepts from individual die to partial wafer or entire wafer up to 12" • Solid base providing a low level of noise once seated on a vibration table • Several configurations of chuck, standard, triax, thermally controlled... • Can accept high-end positioners for an optimum accuracy • Custom configurations upon specsheet  

Request information on : CHARACTERIZATION OF ELECTRONIC LAYERS

You have the right to access, modify, amend and delete information about yourself (art. 34 of the "Freedom and Information" act). In order to exercise this right you can contact: Microworld – 5 Rue de la Verrerie, 38120 Fontanil-Cornillon - Tel: 04 76 56 16 17

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171