The purpose here is electrical characterization of electronic layers using different field-proven methods
• Test by needles and 4-Point-Probe method
• Van Der Pauw measurements for Hall effect and other parameters
• Mercury contact probe is particularly adapted for shallow and fragile layers and for specific materials (SOI…), special technics (Pseudo-Mos…) can be used
Amongst our applications for layers characterization, Microworld also propose the epitaxial growing by RTP (Rapid Thermal Process)
