Microworld offers a wide range of electrical systems to characterize electronic components on wafer or simple samples. From the manual probe station to the semi-automatic probe up to the 300mm (12") wafer. Mini probe stations, compact probe test stations, offering a wide temperature test range from -196°C to 1000°C. These mini stations offer a controlled and completely hermetic environment. You can control the environment with two methods: by injecting a neutral gas or by creating a vacuum.
Microworld offers solutions adapted to your needs as well as for your applications.
A wide choice of accessories and consumables are available to meet your applications.
Equipment and Accessories:
• Manual or semi-automatic probe test stations using I/V measurement, up to 10 micropositioners at the same time on pads less than 10µm.
• Mini manual or semi-automatic probe test stations using I/V measurement, Up to 7 micropositioners at the same time on pads less than 10µm.
• High frequency, high precision, RF, motorized micropositioners...
• Measurement devices, source-meter (Keithley, Keysight), network analyzer...
• Black boxes, Faraday cage, anti-vibration tables
• Cameras and microscopes
• Thermal chucks
• Specific chucks (triaxial connections, high power, etc.)
• Measurement software
• Coax, Triax connection tip holders, with several types of Teflon, delrin, ceramic insulation
• Illumination systems, solar simulator, LED illuminator, fiber optic illuminator.
Applications:
- Electrical test on componant (capacitor, transistor, diode etc..)
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Circuit board (Failure analysis)
- RF test: Antenna, networker ...
