PROBE TESTING

Microworld offers a whole range of systems for electrical characterization electronic components on wafer or on simple samples.

From the manual probe test station to the semi-automatic prober up to the 300mm (12 ") wafer.

A wide choice of accessories and consumables are available to meet your applications.

- IV and CV measurements
- HV measurements (10KV)
- Low current fA measurements
- Microwave measurements (1THz millimetric)
- Thermal chucks (hot/cold : -60°C to 600°C)
- Microscopy
- Light and vibration isolation
- Probe tips and probes
- Dedicated micropositioner
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171