Microworld offers a whole range of systems for electrical characterization electronic components on wafer or on simple samples.
From the manual probe test station to the semi-automatic prober up to the 300mm (12 ") wafer.
A wide choice of accessories and consumables are available to meet your applications.
- IV and CV measurements
- HV measurements (10KV)
- Low current fA measurements
- Microwave measurements (1THz millimetric)
- Thermal chucks (hot/cold : -60°C to 600°C)
- Microscopy
- Light and vibration isolation
- Probe tips and probes
- Dedicated micropositioner
