Paul has recently joined our Sales Team as Semiconductor materials and technology specialist, please welcome him on-board
Some New products arriving soon : Thermal conditioning systems for temperature characterisation, 4-Point-Probe with Evolutive customised software…
Next shows events : ERMS Nice France 27-31 September, EuMW European Microwave Week Paris France 1-3 October

Probing with a probecard & Mapping

The sample holders are different upon material thickness, they are composed of a small pcb on which is placed the sample under test (max dimensions 20x20 mm) • 4 spring adjustable clips hold the sample by each of the sides • Several models are available
Probe card adapter
Probe card adapter

Mechanical fixture for mounting a probecard of 4.5" width (114mm) on a prober. Objective : provide signals to the DUT while making analysis with separate needles controlled from micropositionners2 models are available, one with no adjustment, another with theta adjustment ...

Passive antivibration table
Passive antivibration table
  • Dimensions : Upon demand
  • Use : Probe station, AFM, Microscopy
  • Feet : Height adjustable

The 4 air pads efficiently filter the mechanical noise from the ground or neighbourhood for an ultra fine probe analysis, inspection or assembly. Platen available in several dimensions upon size and weight of the equipmentMarble thickness is selected in function of the equipment seated onFaebi pads with air filling using compressor or bike pump (air line not needed)Several options (wheel, LCD sta...

Probe card
Probe card

The probecards fullfill all production probing applications and particularly the highly demanding nowadays circuits : high pincount, ultra-fine pitch, multi-DUT testing, specific constraint (low-k, probe over active area....) Pcb design available for custom boards (all commercial testers)All services of specific design, manufacture, diagnostic and repair, alignment...Available for pads test or b...

General purpose probe station
General purpose probe station
  • Wafer size : Individual die, partial wafer, max 200 mm
  • Chuck travel X-Y : 200/300 mm

The S1160 will support a broad range of precision probing applications including IV, CV, dies, wafers... Modular, it can accept many options and accessories for multi-purpose (temperature, low current...) applications Accept basic microscope (bino / trino) or high power multi-objectives microscopeQuick platen lift allows replacing the wafer under test easilyHigh frequency RF version available WL11...

The High Power Microscope
The High Power Microscope
  • Magnification range : 20 to 2000 X
  • Camera capable : Yes

Microscope for fine inspection and high magnifications, the PSM1000 combines a high level of technicity and a quality/price second to none ratio A range of standard accessories is available including a variety of objectivesThe trinocular head accepts a choice of caméras (analog or digital)The microscope can be used as a stand alone inspection microscope or mounted onto Analytical probers...

Submicronic checkmate probe station
Submicronic checkmate probe station
  • Wafer size : 200 mm
  • Theta range : +- 7.5 Degrees
  • Movement : Manual

The Checkmate serie represents the state of the art for probing stations, available for probing on individual die or on wafer up to 8" or 12". The probe stations allow high performance for pads probing or internal linesOn-site upgradability from one version to anotherA variety of options and accessories will fulfill all applications, including cold characterization @-65°C and femtoamp measuremen...

6'' semi-automatic probe station
6'' semi-automatic probe station

Semi-automatic prober for wafers up to 6" in diameter with manual loading-unloading, wide range of applications including failure analysis, design-debug, product engineering, and low-medium volume production testing. The Signatone Solutions Windows software provides user friendly wafer mapping and can interface thru GPIB to several instrument control software packages to provide a truly automated...

Submicronic semi-automatic probe station
Submicronic semi-automatic probe station
  • Wafer size : 200
  • Software : Mapping, autoalignement, autofocus, pattern...

Semi-automatic probing stations for probing on individual die or on wafers up to 8" or 12" with mapping, auto-alignment, pattern recognition, autofocus... This family of probe stations allows high performance for pads probing or internal lines manually or automaticallyA variety of options etamp; accessories responds to all applicationsCold characterization (-65°C) and femtoamp measurement are pa...

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171