Hall effect measurement systems

EQUIPMENT FOR THIN LAYER CHARACTERIZATION - Hall effect measurement systems

These systems use a specific technic to extract electrical characteristics from electronic thin layers.
The samples for measurement are square contacted on each four side by a spring needle.
The Hall effect measurement is used to determine semiconductor parameters such as I-R, I-V graphs, conductivity, carriers concentration, Hall coefficient...
• Applicable materials :  Si, SiGe, SiC, GaAs, InGaAs, InP, GaN, TCO(including ITO), AlZnO, FeCdTe, ZnO... And all semiconductors (N/P-type)
• Measuring samples size : De 5X5 mm à 25x25 mm, épaisseur < 2 mm
• Fixed magnets of different values
• Cold T° starting at 77K, ambient or high temperatures up to 770K
• Optional Continuous temperature variation during measurement
Standard range
Temperature range
Serie of systems for temperature measurements of the parameters obtained by Van Der Pauw Hall effect technic
• HMS5000 
• HMS5300 high temp.
• HMS5500 very high temp.
HMS5000
Temperature Hall Effect measurement system (semi-automatic)
Temperature Hall Effect measurement system (semi-automatic)
The HMS5000 model is aimed to characterize a variety of semiconductor layers accessible by needles.
It measures parameters using Van Der Pauw method : resistivity, mobility, carrier concentration, hall effect... with constant current source and permanent magnets
The system provides an access to the true characterization of semiconductors layers, compounds, solar cells...


The typical configuration includes :

- Magnet modul : 0.55T
- Easy clip holder and contact on the sample under test
- Temperature ranging

The HMS5000 includes software with I-V curve capability for checking the ohmic integrity of the user made sample contacts. The systems can be used to characterize various materials including semiconductors and compound semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, DaAs, InGaAs, InP, GaN, ZnO, TCOs, metals, etc., at both 350K and 77K (liquid nitrogen temperature).
HMS5300
High temperature Hall Effect measurement system (semi-automatic)
High temperature Hall Effect measurement system (semi-automatic)
The HMS5300 comes as a complement for the users of HM5000 allowing a higher temperature range.

- It measures semiconductor parameters using Van Der Pauw method : resistivity, mobility, carrier concentration, hall effect... with constant current source
- 0.55T magnet
- Easy clip sample holder for sample sizes of 5*5mm to 25*25mm
- Measurement from 77K to 570K

The HMS5300 includes software with I-V curve capability for checking the ohmic integrity of the user made sample contacts. The systems can be used to characterize various materials including semiconductors and compound semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, DaAs, InGaAs, InP, GaN, ZnO, TCOs, metals...
HMS5500
Very high temperature Hall Effect measurement system (semi-automatic)
Very high temperature Hall Effect measurement system (semi-automatic)
The HMS5500 comes as a complement for the users of HM5000 adding the capability of a much higher temperature range.
It measures parameters using Van Der Pauw method : resistivity, mobility, carrier concentration, hall effect... with constant current source

- 0.55T magnet
- Easy clip sample holder for sample sizes of 5*5mm to 25*25mm
- Temperature measurement 77K to 770K

The HMS5500 includes software with I-V curve capability for checking the ohmic integrity of the user made sample contacts. The systems can be used to characterize various materials including semiconductors and compound semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, DaAs, InGaAs, InP, GaN, ZnO, TCOs, metals, etc...
Special Photonic
Sample holders
Electro-magnet type
Halbach configuration
Flexible system
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171