TF map 2530Semi-automatic Eddy Current tester
The EddyCus map 2530 TM automatically measures the sheet resistance of large samples up to 300 × 300 mm² (12 × 12 inches) in non-contact mode. After manual placement of the sample, the system performs a fully automated scan and generates a high-resolution sheet resistance map across the entire surface.
The tool uses a stationary eddy current sensor, while the sample stage moves to enable scanning. This design allows for measurements on the fly, with no physical contact required, eliminating errors due to contact resistance. Depending on the selected settings, users can prioritize fast measurement times (under 1 minute) or high spatial resolution (up to 90,000 measurement points per scan).
The non-contact measurement ensures high accuracy and repeatability, independent of surface condition or contact quality. The dense measurement grid enables reliable detection of material variations, inhomogeneities, and defects. The included software offers a wide range of advanced analysis tools, supporting systematic quality control of thin films in both manufacturing and research environments.
The device is typically used for:
- Technology: non-contact eddy current
- Imaging by multipoint mapping
- Sampling area: 300 x 300 mm
- Recommended sample sizes: 1 inch to 12 inch or 25 to 300 mm
The EddyCus map 2530, which exists in several versions, allows measurements of:
- Sheet resistance
- Resistivity
- Thickness
- Anisotropy
- Emissivity
Advantages:
- Non-contact measurement
- Non-destructive
- Fast and accurate measurement
- High resolution mapping of conductive thin layers
- Imaging of substrates
- Detection of defects and analysis of coatings
- Characterization of hidden and encapsulated conductive layers
- Various analysis functions built into the software (sheet resistance distribution, line scan, single point analysis...)
- Measurement data backup and export functions
Applications:
- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafer and photovoltaic cells
- Semiconductor wafer
- Metallization layer and wafer metallization
- Battery electrodes
- Conductive paper and textiles
- Organic conductor - Polymer
The tool uses a stationary eddy current sensor, while the sample stage moves to enable scanning. This design allows for measurements on the fly, with no physical contact required, eliminating errors due to contact resistance. Depending on the selected settings, users can prioritize fast measurement times (under 1 minute) or high spatial resolution (up to 90,000 measurement points per scan).
The non-contact measurement ensures high accuracy and repeatability, independent of surface condition or contact quality. The dense measurement grid enables reliable detection of material variations, inhomogeneities, and defects. The included software offers a wide range of advanced analysis tools, supporting systematic quality control of thin films in both manufacturing and research environments.
The device is typically used for:
- Technology: non-contact eddy current
- Imaging by multipoint mapping
- Sampling area: 300 x 300 mm
- Recommended sample sizes: 1 inch to 12 inch or 25 to 300 mm
The EddyCus map 2530, which exists in several versions, allows measurements of:
- Sheet resistance
- Resistivity
- Thickness
- Anisotropy
- Emissivity
Advantages:
- Non-contact measurement
- Non-destructive
- Fast and accurate measurement
- High resolution mapping of conductive thin layers
- Imaging of substrates
- Detection of defects and analysis of coatings
- Characterization of hidden and encapsulated conductive layers
- Various analysis functions built into the software (sheet resistance distribution, line scan, single point analysis...)
- Measurement data backup and export functions
Applications:
- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafer and photovoltaic cells
- Semiconductor wafer
- Metallization layer and wafer metallization
- Battery electrodes
- Conductive paper and textiles
- Organic conductor - Polymer