Eddy Current system semiautomatic

TF map 2525SREddy Current system semiautomatic

The TF map 2525 series automatically extracts intrinsic features from samples up to 250 x 250mm (10 x 10 inches) in non-contact and therefore non-destructive mode.
When manually positioning the sample, the device automatically measures and displays the distribution of properties over the entire sample area.
The measurement settings make it easy and flexible to choose between fast measurement times of less than 1 minute or high spatial measurement resolution of over 50,000 measurement points per sample. The resulting mapping gives a true overview of the homogeneity and quality of transparent or opaque substrate.
The compact device allows, depending on its configuration, to precisely extract the surface resistance, the resistivity, the thickness or even the anisotropy

Advantages:

- Non-contact measurement
- Non-destructive
- Fast and accurate measurement
- High resolution mapping of conductive thin layers
- Imaging of substrates
- Detection of defects and analysis of coatings
- Characterization of hidden and encapsulated conductive layers
- Various analysis functions built into the software (sheet resistance distribution, line scan, single point analysis...)
- Measurement data backup and export functions

Applications:

- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafer and photovoltaic cells
- Semiconductor wafer
- Metallization layer and wafer metallization
- Battery electrodes
- Conductive paper and textiles
- Organic conductor
- Polymer
- Coated architectural glass
- Smart electrochromic glass, Smart Glass
Eddy Current system semiautomatic

TF map 2530Eddy Current system semiautomatic

The TF map 3030 Series auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 300 x 300 mm (12 x 1é inches) in non-con­tact mode.
Upon manu­al sample po­s­i­tion­ing the device auto­mat­ic­ally meas­ures and dis­plays an ac­cur­ate map­ping of the sheet res­ist­ance across the en­tire sample area.
The measurement settings make it easy and flexible to choose between fast measurement times of less than 1 minute or high spatial measurement resolution of over 100,000 measurement points.

The TF map 2530, which exists in several versions, allows measurements of:
- Sheet resistance
- Resistivity
- Thickness
- Anisotropy

Advantages:

- Non-contact measurement
- Non-destructive
- Fast and accurate measurement
- High resolution mapping of conductive thin layers
- Imaging of substrates
- Detection of defects and analysis of coatings
- Characterization of hidden and encapsulated conductive layers
- Various analysis functions built into the software (sheet resistance distribution, line scan, single point analysis...)
- Measurement data backup and export functions

Applications:

- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafer and photovoltaic cells
- Semiconductor wafer
- Metallization layer and wafer metallization
- Battery electrodes
- Conductive paper and textiles
- Organic conductor - Polymer
ABOUT OUR Semi-automatic systems
The TFMap series can automatically extract the intrinsic characteristics of samples up to 250 x 250mm (10 x 10 inches) in non-contact and therefore non-destructive mode. The measurement results, displayed in a map, give a true overview of the homogeneity and quality of the layer. These compact systems make it possible, depending on its configuration, to precisely extract the sheet resistance, the resistivity, the thickness or even the anisotropy of different materials.

Benefits:

• No-contact measurement
• No-destructive
• Fast and accurate measurement
• High resolution mapping of conductive thin layers
• Imaging of substrates
• Detection of defects and analysis of coatings
• Characterization of hidden and encapsulated conductive layers
• Various analysis functions built in the software (sheet resistance distribution, line scan, single point analysis...)
• Measurement data backup and export functions

Applications:

- Thin coating layers
- Conductive films
- Conductive papers and textiles
- Encapsulated components
- Metals
- Photoelectric sensors
- Organic conductors
- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafers and photovoltaic cells
- Battery electrodes
- Conductive polymers
For technical and commercial information, quote, ordering or request of visit by our representative.
+33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171