NEW ! Thermal forcing system providing hot and cold temperature
NEW ! Hall Effect Measurement System with Variable Magnet
Our Test and burn-in Sockets accommodate ALL packages, Standard or Custom
NEW : Ovens and burn in chamber for bringing temperatures on devices or sub-assemblies

CatalogPROBE STATIONS

PROBE STATIONS

We offer a full range of equipment's covering all needs of analysis under needles from single chip to 300 mm wafer, economical probe stations or automated high precision models...Depending on the budget available and your product complexity, Microworld has the perfect solution for you.

Request information about : PROBE STATIONS

You have the right to access, modify, amend and delete information about yourself (art. 34 of the "Freedom and Information" act). In order to exercise this right you can contact: Microworld – 5 Rue de la Verrerie, 38120 Fontanil-Cornillon - Tel: 04 76 56 16 17

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617
Products Categories

PROBE STATIONS

ACCESSORIES FOR PROBE STATIONS

TEST PROBES

EQUIPMENT FOR THIN LAYER CHARACTERIZATION

PRODUCTS FOR COMPONENTS TESTÌNG AND BURN IN

EQUIPMENT FOR DICING AND RELATED PROCESSES

CONSUMABLE FOR DICING PROCESSES

Applications

CHARACTERIZATION OF ELECTRONIC LAYERS

INSTRUMENTATION CONTROL

ELECTRICAL TESTS UNDER NEEDLES

TEST ON PACKAGED DEVICES

DICING OF SUBSTRATES

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171