High-precision RF measurements for your most demanding applications.
Designed to meet the requirements of microwave characterization environments, our coaxial RF probes enable reliable, accurate, and repeatable radiofrequency measurements directly on your semiconductor components.
They provide a high-performance solution for the electrical and RF characterization of active and passive components, whether in a research laboratory or an industrial setting.
Specifications:
• Configurations: GSG, GS, SG, GSSG, GSGSG
• Pitch from 25µm to 2540µm
• Various head styles
• 2.9mm K-type female connector
• Available in BeCu, nickel, or tungsten
• Non-magnetic option
• High-temperature and high-current/high-voltage options