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CATEGORY : Material analysis systems - Optical profilometers

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You have the right to access, modify, amend and delete information about yourself (art. 34 of the "Freedom and Information" act). In order to exercise this right you can contact: Microworld – 5 Rue de la Verrerie, 38120 Fontanil-Cornillon - Tel: 04 76 56 16 17

ABOUT OUR Optical profilometers
Our non-contact 3D optical profilometers are based on the Confocal Chromatic technique which uses wavelengths of light to accurately determine physical height. Take advantage of a wide range of models including compact, stand-alone and portable profilometers. High-speed line sensors are available to scan large areas with high accuracy.
A single sweep of the profilometer provides access to multiple material surface parameters such as 3D waviness, roughness, step height, film thickness and even advanced fractal analysis or particle characterization.
Chromatic confocal technology uses white light that passes through a series of lenses with a high degree of chromatic aberration. Each wavelength focuses at a different distance, creating the vertical measurement range. When a surface of interest is within this range, only one wavelength of white light is focused, while all others are out of focus. Only the focused wavelength passes through the hole filter to reach the CCD spectrometer. The measured physical wavelength corresponds to a vertical position.


• Jr25: Portable system
• Jr100: Ultra-fast system
• PS50: Compact system
• ST500: Large area system
• ST400: Standard system


- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171