Mercury contact probing systems

LAYER CHARACTERIZATION - Mercury contact probing systems

The devices of the CVMap series make it possible to measure, characterize and monitor a large number of parameters for semiconductor materials on the quality of the processes themselves.

These systems use Mercury which allow to overcome the damage caused by probe tips to measure on sensitive layers.

- Accepts wafers of all sizes up to 300mm (12")
- Manual or automatic loading
- Measurements of SOI components
- Breakdown measurements
- Oxidation measurements
Semi-automatic mercury C-V system
Semi-automatic mercury C-V system
C-V manual mercury characterization tool for wafer and substrate up to 300 mm

- Manual loading of the sample, automatic measurement
- The CV92M allows Measuring & Characterizing & Monitoring a number of parameters on semiconductors materials including the process monitoring
- Oxide measurement, K parameter, Permittivity
- Cassette to cassette version available
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171