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The Metricon Model 2010/M Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films as well as refractive index of bulk materials. The 2010/M offers unique advantages over conventional refractometers and instruments based on ellipsometry or spectrophotometry:

• Completely General – no advanced knowledge of optical properties of film/substrate required
• Routine index resolution of ±.0005 (accuracy of up to ±.0001 available for many applications)
• Routine index resolution of ±.0003 (resolution of up to ±.00005 available for many applications)
• High accuracy index measurement of bulk, substrate, or liquid materials including birefringence/anisotropy
• Rapid (20-second) characterization of thin film or diffused optical waveguides or SPR sensor structures
• Simple measurement of index vs wavelength
• Options to measure index vs temperature (dn/dT), and waveguide loss
• Wide index measurement range (1.0-3.35)

The Model 2010/M represents a significant improvement over its predecessor, the Model 2010, offering compatibility with Windows XP/Vista/Seven, a greatly improved and user-friendly Windows based control program, and new measurement features such as the ability to make accurate thickness and index measurements of very thick films as well as an option to measure index vs. temperature (dn/dT). It also eliminates the need for the now–obsolete ISA interface card required by the 2010.