ABOUT OUR Standard systems
Our two series of Hall effect analyzers cover a wide range of applications for the advanced characterization of semiconductor materials and thin films.
Based on the Van der Pauw method and the exploitation of Lorentz forces, these systems enable the simultaneous analysis of multiple electrical parameters with high precision, even under varying environmental conditions.
The HMS offers a complete solution for the extraction and analysis of essential electronic properties of materials:
• Charge carrier mobility
• Majority carrier density
• Identification of doping type (P or N)
• Measurement of voltage and Hall coefficient
• Surface resistance and resistivity
Thanks to their versatility and reliability, these instruments meet the needs of both academic research and the requirements of quality control and industrial development.
HMS3000:
• Fixed temperature: Ambient or 77K (-196°C)
• Several compatible magnet modules (including two variable magnet modules)
HMS5000:
• Fixed magnet: 0.51T
• Several temperature modules (from 77K to 770K)
• Semi-automatic system
Applications:
- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCOs
- Optoelectronic component
- Nanomaterials
- Sensors, MEMS
- Conductive polymer
- Oxide deposit
- Ceramic & Glass
- Batteries
- Electrodes
- Photovoltaic
