PS50 : Compact optical profilometer PS50 : Compact optical profilometer

Part Number



Compact optical profilometer


Designed with Chromatic Light technology, which measures wavelengths, PS50 offers the highest precision on all roughnesses, all shapes and all materials. Transparent or opaque.

Thanks to a displacement of 50 x 50 mm on the X-Y axes, this portable optical profilometer allows high-speed measurements and does not require gluing of images.

A compact unit with high speed sensor is truly a gateway to the frontier of profilometry.


- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering


- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers


Technical Specifications

XY travel

50x50 mm

Z-Axis Clearance

30 mm manual

XY speed

Max 20 mm/s

Vertical resolution

Max 1 nm

Surface angle

Max 87 °

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171