PS50      Compact optical profilometer

Designed with Chromatic Light technology, which measures wavelengths, PS50 offers the highest precision on all roughnesses, all shapes and all materials. Transparent or opaque.

Thanks to a displacement of 50 x 50 mm on the X-Y axes, this portable optical profilometer allows high-speed measurements and does not require gluing of images.

A compact unit with high speed sensor is truly a gateway to the frontier of profilometry.

Benefits:

- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers