Microworld offers a wide choice of test sockets to perform electrical and premature aging measurements on encapsulated chips (housings).
From the simple socket type BGA, QFN, LCC, SOT, DFN... to the Burn In card.
We also offer more complex and custom sockets to meet your needs.
Why choose Microworld? A team attentive to your needs, 30 years of experience in the field. Recognized partners in the world of semiconductors. Test sockets suitable for all types of high power, high temperature, Kelvin, non-magnetic tests...
Applications:
- Custom tests
- Nanotechnology
- Robotics
- Automotive
- Aerospace
- Aeronautics
