ST400      Standard optical profilometer

Designed with Chromatic Light Technology, the ST400 Optical Profiler measures physical wavelengths and delivers the highest accuracy on any surface roughness, shape, and material. Transparent or opaque.

Movement on the X-Y axes of 200 x 150 mm with speeds of up to 40 mm/s. Provides fast measurements on a wide range of samples with varying geometries. No image sticking!

The advanced software makes it easy to select which areas of the screen will be scanned automatically. Quality control options are available to automate all aspects of testing, including pattern recognition, database communication, macros and analysis recipes.

Benefits:

- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers