ST400      Standard optical profilometer

ST400 : Standard optical profilometer
ST400 : Standard optical profilometer

Part Number



Standard optical profilometer


Designed with Chromatic Light Technology, the ST400 Optical Profiler measures physical wavelengths and delivers the highest accuracy on any surface roughness, shape, and material. Transparent or opaque.

Movement on the X-Y axes of 200 x 150 mm with speeds of up to 40 mm/s. Provides fast measurements on a wide range of samples with varying geometries. No image sticking!

The advanced software makes it easy to select which areas of the screen will be scanned automatically. Quality control options are available to automate all aspects of testing, including pattern recognition, database communication, macros and analysis recipes.


- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering


- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers


Technical Specifications

XY travel

200x150 mm

Z-Axis Clearance

50 mm motorized

XY speed

Max 40 mm/s

Vertical resolution

Max 1 nm

Surface angle

Max 87 °

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171