Quote Request


PRODUCT : TF map 2530 - Semi-automatic Eddy Current tester

* Mandatory fields

You have the right to access, modify, amend and delete information about yourself (art. 34 of the "Freedom and Information" act). In order to exercise this right you can contact: Microworld – 5 Rue de la Verrerie, 38120 Fontanil-Cornillon - Tel: 04 76 56 16 17


Semi-automatic Eddy Current tester

The EddyCus map 2530 TM automatically measures the sheet resistance of large samples up to 300 × 300 mm² (12 × 12 inches) in non-contact mode. After manual placement of the sample, the system performs a fully automated scan and generates a high-resolution sheet resistance map across the entire surface.

The tool uses a stationary eddy current sensor, while the sample stage moves to enable scanning. This design allows for measurements on the fly, with no physical contact required, eliminating errors due to contact resistance. Depending on the selected settings, users can prioritize fast measurement times (under 1 minute) or high spatial resolution (up to 90,000 measurement points per scan).

The non-contact measurement ensures high accuracy and repeatability, independent of surface condition or contact quality. The dense measurement grid enables reliable detection of material variations, inhomogeneities, and defects. The included software offers a wide range of advanced analysis tools, supporting systematic quality control of thin films in both manufacturing and research environments.

The device is typically used for:
- Technology: non-contact eddy current
- Imaging by multipoint mapping
- Sampling area: 300 x 300 mm
- Recommended sample sizes: 1 inch to 12 inch or 25 to 300 mm

The EddyCus map 2530, which exists in several versions, allows measurements of:
- Sheet resistance
- Resistivity
- Thickness
- Anisotropy
- Emissivity

Advantages:
- Non-contact measurement
- Non-destructive
- Fast and accurate measurement
- High resolution mapping of conductive thin layers
- Imaging of substrates
- Detection of defects and analysis of coatings
- Characterization of hidden and encapsulated conductive layers
- Various analysis functions built into the software (sheet resistance distribution, line scan, single point analysis...)
- Measurement data backup and export functions

Applications:
- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafer and photovoltaic cells
- Semiconductor wafer
- Metallization layer and wafer metallization
- Battery electrodes
- Conductive paper and textiles
- Organic conductor - Polymer

For technical and commercial information, quote, ordering or request of visit by our representative.
+33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171