LAYER CHARACTERIZATIONNon destructive measurement systemsSemi-automatic systems

TF map 2530 Semi-automatic Eddy Current tester

Part Number

TF map 2530

Designation

Semi-automatic Eddy Current tester

Description

The EddyCus map 2530 TM automatically measures the sheet resistance of large samples up to 300 × 300 mm² (12 × 12 inches) in non-contact mode. After manual placement of the sample, the system performs a fully automated scan and generates a high-resolution sheet resistance map across the entire surface.

The tool uses a stationary eddy current sensor, while the sample stage moves to enable scanning. This design allows for measurements on the fly, with no physical contact required, eliminating errors due to contact resistance. Depending on the selected settings, users can prioritize fast measurement times (under 1 minute) or high spatial resolution (up to 90,000 measurement points per scan).

The non-contact measurement ensures high accuracy and repeatability, independent of surface condition or contact quality. The dense measurement grid enables reliable detection of material variations, inhomogeneities, and defects. The included software offers a wide range of advanced analysis tools, supporting systematic quality control of thin films in both manufacturing and research environments.

The device is typically used for:
- Technology: non-contact eddy current
- Imaging by multipoint mapping
- Sampling area: 300 x 300 mm
- Recommended sample sizes: 1 inch to 12 inch or 25 to 300 mm

The EddyCus map 2530, which exists in several versions, allows measurements of:
- Sheet resistance
- Resistivity
- Thickness
- Anisotropy
- Emissivity

Advantages:
- Non-contact measurement
- Non-destructive
- Fast and accurate measurement
- High resolution mapping of conductive thin layers
- Imaging of substrates
- Detection of defects and analysis of coatings
- Characterization of hidden and encapsulated conductive layers
- Various analysis functions built into the software (sheet resistance distribution, line scan, single point analysis...)
- Measurement data backup and export functions

Applications:
- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafer and photovoltaic cells
- Semiconductor wafer
- Metallization layer and wafer metallization
- Battery electrodes
- Conductive paper and textiles
- Organic conductor - Polymer

DOCUMENTS

TF map 2530SR eddy current tester (pdf)

Technical Specifications

Measurement technology

Non-contact eddy current sensor

Sample size

300 x 300 mm

Maximum sample thickness

2 mm

Sheet resistance range

0.1 to 10 Ohm/sq

Movement

Semi-automatic

XY speed

500 mm/s

SMU

Internal

Data export

CSV, PDF

Industrial mode

Yes

Connection

Ethernet

Computer

Not included (optional)

Dimensions

785 x 805 x 486 mm

Weight

90 Kg

Associated products

TF labManual Eddy Current tester

The EddyCus® lab 2020 SR Series is a compact, benchtop system designed for non-contact, single-point measurements of conductive thin films, metal layer thicknesses, and sheet resistance using eddy current technology. It enables fast, accurate measurements of samples up to 200 x 200 mm² (8 x 8 inches) and supports a broad range of materials, including thin metal layers, doped wafers, and conductive polymers.

The EddyCus® lab 2020 offers a modern, contact-free alternative to traditional 4-point probe (4PP) and other contact-based measurement methods. Unlike 4PP systems, it requires no physical contact, no surface preparation, and is unaffected by encapsulations or surface roughness. You can learn more about the comparison between eddy current and 4PP methods.

These advantages make the EddyCus® lab 2020 an excellent choice for R&D laboratories, quality control, and process monitoring, where speed, repeatability, and non-destructive testing are essential.

The EddyCus® lab 2020, which exists in several versions, allows measurements of:
- Surface resistance
- Resistivity
- Metal layer thickness
- Conductivity
- Anisotropy
- Emissivity

Advantage:
- Non destructive measurement
- Ultra-fast non-contact real-time measurement
- Accurate measurement of conductive thin layers at different penetration depths
- Characterization of hidden and encapsulated conductive layers
- Easy to use software & display of results in real time

Applications:
- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafer and photovoltaic cells
- Semiconductor wafer
- Metallization layer and wafer metallization
- Battery electrodes
- Paper and textile conductors
- Organic conductor
- Polymer
- Coated architectural glass
- Smart electrochromic glass, Smart Glass

TF portableHandheld Eddy Current tester

The portable TF 1010 system is a compact and portable measuring device for resistivity measurement over large areas. It allows the characterization by rapid contact of large conductive surfaces. The system uses the eddy current method. This method allows for non-destructive measurements. It is possible to measure encapsulated samples and components thanks to these weak currents which penetrate non-conductive layers such as oxides or any other coatings. The TF Portable 1010 is an easy-to-use device controlled via a touch screen. Compact, it allows, depending on its configuration, to precisely extract the surface resistance, the resistivity, the thickness or even the anisotropy of a material.

Advantages:

- Small and portable measurement device
- Manual measurement
- Instant live measurement
- Digital data collection and data transmission via Bluetooth
- Characterization of hidden and encapsulated conductive layers

Application:

- Architectural Glass (LowE)
- Mirror coatings
- Reflective layers
- Packaging foils
- Electrode layers in smart / electrochromic glass and energy storage
- Battery electrodes
- Conductive paper and conductive textiles
- Conductor Polymers