Our test equipment will allow you to meet all simple and demanding technical specifications. Whatever the application, chip characterization, debugging, failure analysis or industrial process development and R&D. Manual and semi-automatic sub-point stations are both versatile and precise. From standard measurement to microwave or high temperature measurement to meet the requirements of microelectronics.
Applications:
- Electrical test: resistor, transistor, capacitor
- RF test: Antenna, networker ...
- Circuit board (Failure analysis)
- Nanomaterials
- Electrodes, diodes
- Photovoltaic
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
Specifications:
• IV and CV measurements
• HV measurements (10KV)
• Low current measurements fA
• Microwave measurements (1 THz millimetric)
• Thermal chucks (hot/cold: -196°C to 1000°C)
• Microscopy
• Light and vibration isolation
• Test tips and probes
• Dedicated micropositioners for each application
