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CATEGORY : Probe stations

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You have the right to access, modify, amend and delete information about yourself (art. 34 of the "Freedom and Information" act). In order to exercise this right you can contact: Microworld – 5 Rue de la Verrerie, 38120 Fontanil-Cornillon - Tel: 04 76 56 16 17

ABOUT OUR Probe stations
Our test equipment will allow you to meet all simple and demanding technical specifications. Whatever the application, chip characterization, debugging, failure analysis or industrial process development and R&D. Manual and semi-automatic sub-point stations are both versatile and precise. From standard measurement to microwave or high temperature measurement to meet the requirements of microelectronics.

Applications:


- Electrical test: resistor, transistor, capacitor
- RF test: Antenna, networker ...
- Circuit board (Failure analysis)
- Nanomaterials
- Electrodes, diodes
- Photovoltaic
- Sensors, MEMS, OLED, infrared...
- Silicon wafer

Specifications:


• IV and CV measurements
• HV measurements (10KV)
• Low current measurements fA
• Microwave measurements (1 THz millimetric)
• Thermal chucks (hot/cold: -196°C to 1000°C)
• Microscopy
• Light and vibration isolation
• Test tips and probes
• Dedicated micropositioners for each application
For technical and commercial information, quote, ordering or request of visit by our representative.
+33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171