ABOUT OUR Semi-automatic systems
The TFMap series can automatically extract the intrinsic characteristics of samples up to 250 x 250mm (10 x 10 inches) in non-contact and therefore non-destructive mode. The measurement results, displayed in a map, give a true overview of the homogeneity and quality of the layer. These compact systems make it possible, depending on its configuration, to precisely extract the sheet resistance, the resistivity, the thickness or even the anisotropy of different materials.
Benefits:
• No-contact measurement
• No-destructive
• Fast and accurate measurement
• High resolution mapping of conductive thin layers
• Imaging of substrates
• Detection of defects and analysis of coatings
• Characterization of hidden and encapsulated conductive layers
• Various analysis functions built in the software (sheet resistance distribution, line scan, single point analysis...)
• Measurement data backup and export functions
Applications:
- Thin coating layers
- Conductive films
- Conductive papers and textiles
- Encapsulated components
- Metals
- Photoelectric sensors
- Organic conductors
- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafers and photovoltaic cells
- Battery electrodes
- Conductive polymers
