SP4      4 point probe head

Description Technical Specifications Documents Associated Products
Description Technical Specifications Documents Associated Products

Part Number

SP4

Designation

4 point probe head

Description

Ambient 4-point probe head for ambient temperature, useable on Pack4PP and Quadpro series equipment or for separate uses. The standard head is molded in delrin with tungsten tips. A bayonet and two screws alllow the head to be fixed to our 4 points probe stand easily for precise and repeatable measurements.

- Tips material is function of the electronic layer under measure
- Variety of spacing, tip materials and radius, needle pressure
- Termination with flying wires or Banana jacks or BNC or triax cables or 9-Pins connector...

MOST POPULAR REFERENCES

  • SP4-40045TRY : Spacing 1mm, pressure 45g, Tungsten, radius 40µm, 9pin D sub
  • SP4-40045ORY : Spacing 1mm, pressure 45g, Osmium, radius 40µm, 9pin D sub
  • SP4-40045TBJ : Spacing 1mm, pressure 45g, Tungsten, radius 254µm, 4 banana jack
  • SP4-40085TFJ : Spacing 1mm, pressure 85g, Tungsten, radius 125µm, 4 banana jack
  • SP4-50085TRN : Spacing 1.27mm, pressure 85g, Tungsten, radius 40um, 4 BNC wire

DOCUMENTS

Technical Specifications

Tip radius

25, 100, 300, 500 µm

Spacing

1, 1.27, 1.6 mm

Pressure

N/A

Material

Tungstene or Osmium

Connections

Upon reference

Cable length

N/A

Max Current

10 DC to 450 pulsed A

Max Voltage

20 V

Associated products

MW-Pack4PP-M - 4 point probe manual measurement package medium resistivity range
Manual sheet resistivity measurement systems for laboratory, for research and small productions. The stand includes several features to ensure accurate resistivity measurements. The system is used to characterize materials made by semiconductor doping, metal deposition, resistive paste printing, glass coating...

A manual lever makes is used to make the Z movement to be in contact with the sample, with a repeatability of the order of one micron. In addition, a control wheel located on the right side allows to precisely refine the Z movement. The sample is mounted on a movable support, which makes it possible to be places under the four point probe head easily between each measuring point.


- A micro-switch insures that the current will be injected only after contact of the 4 needles
- The measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family (supplied upon version)
- The system is modular including the measurement and display onto a PC

Th software manages the tests, displays results and allows printouts or export of the data. The user inputs the size and shape of the sample, edge exclusion and number of points to be tested. The user may also define pass/fail criteria and which parameter (Sheet Resistance, Resistivity, or V/I) to display. A graphic picture of the target probe points is displayed. Prompts tell user to move to the next position. Upon completion of testing all points, the average, standard deviation, minimum and maximum are prominently displayed. Upon completion, a summary report may be printed showing the data and pass/fail status.
S302 - 4 point probe stand
The configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 4, 6, 8 or 12 inches, the sample positioning is manual as well as the contact of the tips by a rotating lever.

- A micro-switch insures that the current will be injected only after contact of the 4-point probe head
- The  measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family, which can be supplied if requested
- The system can be upgraded to include the measurement and display onto a PC
- Perfect tool for for laboratories, universities, research centers... in the material characterization.
K2450 - Keithley sourcemeter integrated on Microworld products
Single channel laboratory equipment for various measurements

The rated output voltage varies between ± 20 mV and ± 200 V and the rated output current is ± 10 nA and ± 1 A.
It also offers a large dynamic range, which makes the 2450 Series model well suited for tabletop and system applications with low voltage requirements.

Applications : 4-point measurements, nanomaterials, semiconductor structures, measurement of energy efficiency and lighting, material characterisation, real current source, digital multimeter, trigger controller ...
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

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