LAYER CHARACTERIZATIONHall effect measurement systemsStandard systems

HMS3300 Manual Hall Effect measurement system for high temperatures

Part Number

HMS3300

Designation

Manual Hall Effect measurement system for high temperatures

APPLICATIONS

Hall Effect Measurements and other parameters

Description

The HMS3300 is a manual device for Hall effect measurement of resistivity, mobility, carrier concentration, Hall effect coefficient...
It uses the Van Der Pauw method and makes it possible to characterize semiconductor layers of different thicknesses.
This ultra-compact equipment is compatible with several magnet kits (0.31T, 0.37T, 0.51T, 1T) but also with a variable magnet module.
The HMS3000 includes software capable of checking the quality of ohmic contacts by plotting I-V curves.

Features:

- Sample size: 5x5mm to 25x25 mm
- Measurement at two temperatures, ambient (ambient temperature) and 77K
- Magnet
- LN2 chamber with funnel
- ITO reference sample
- Different SPCB sample holders depending on the application

Module # EVM-100
Field: 0.25~0.9T at room temperature
Field: 0.25~0.5T at room temperature and 77K

Applications:

- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCOs
- Optoelectronic component
- Nanomaterials - Sensors, MEMS
- Conductive polymer
- Oxide deposit
- Ceramic & Glass
- Batteries
- Electrodes
- Photovoltaic

Technical Specifications

Sample size

5x5 to 25x25 mm

Maximum sample thickness

2.5 mm

Magnet power

0.5 T

Magnet type

Permanent

Magnet material

Neodym

Magnet diameter

50 mm

Magnet movement

Manual

Temperature range

Ambient to 300°C

SMU

Internal

Current range

1nA to 20mA

Resistivity range

10E-4 to 10E7 ohm.cm

Concentration range

10E7 to 10E21 cm-3

Mobility range

1 to 10E7 cm2/Vs

Software

Yes (Windows)

License

Multi-users

IV curves

Yes

Parameters calculation

R, Res, Mob, Concentration, Hall

Temperature ramp

Data export

CSV

Computer

Not included (optional)

Associated products

SPCBSample holder for HMS series

These easy probe holders are composed of a small pcb on which the sample under test is held using spring clips.
The sample to measure is square with a pretty small size.

- Four individually adjustable gold plated spring needles allow a good electrical contact on each corner (may need a point of Indium solder deposited for better contact, not always necessary, depends on sample material).
- No soldering necessary

HMS3000Manual Hall Effect measurement system

The HMS3000 is a manual device for Hall effect measurement of resistivity, mobility, carrier concentration, Hall effect coefficient...
It uses the Van Der Pauw method and makes it possible to characterize semiconductor layers of different thicknesses.
This ultra-compact equipment is compatible with several magnet kits (0.31T, 0.37T, 0.51T, 1T) but also with a variable magnet module.
The HMS3000 includes software capable of checking the quality of ohmic contacts by plotting I-V curves.

Features:

- Sample size: 5x5mm to 25x25 mm
- Measurement at two temperatures, ambient (ambient temperature) and 77K
- Magnet
- LN2 chamber with funnel
- ITO reference sample
- Different SPCB sample holders depending on the application

Module # EVM-100
Field: 0.25~0.9T at room temperature
Field: 0.25~0.5T at room temperature and 77K

Applications:

- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCOs
- Optoelectronic component
- Nanomaterials - Sensors, MEMS
- Conductive polymer
- Oxide deposit
- Ceramic & Glass
- Batteries
- Electrodes
- Photovoltaic

HMS3500Manual Hall Effect measurement system for very high temperatures

The HMS3500 is a manual device for Hall effect measurement of resistivity, mobility, carrier concentration, Hall effect coefficient...
It uses the Van Der Pauw method and makes it possible to characterize semiconductor layers of different thicknesses.
This ultra-compact equipment is compatible with several magnet kits (0.31T, 0.37T, 0.51T, 1T) but also with a variable magnet module.
The HMS3000 includes software capable of checking the quality of ohmic contacts by plotting I-V curves.

Features:

- Sample size: 5x5mm to 25x25 mm
- Measurement at two temperatures, ambient (ambient temperature) and 77K
- Magnet
- LN2 chamber with funnel
- ITO reference sample
- Different SPCB sample holders depending on the application

Module # EVM-100
Field: 0.25~0.9T at room temperature
Field: 0.25~0.5T at room temperature and 77K

Applications:

- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCOs
- Optoelectronic component
- Nanomaterials - Sensors, MEMS
- Conductive polymer
- Oxide deposit
- Ceramic & Glass
- Batteries
- Electrodes
- Photovoltaic