MW-TopMap-Micro.View      Optical profilometer for 3D roughness

TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this Coherence Scanning interferometer.
The extended 100 mm large Z measurement range with Continuous Scanning Technology (CST) measures microstructures and textures of precision surfaces with sub-nm resolution. The convenient table-top setup features integrated electronics, with the advanced Focus Finder simplifying and speeding up the measurement procedure.

Benefit from the optional ECT Environmental Compensation Technology, enabling reliable and accurate measurement results even in noisy and challenging production environments. Add the custom TopMap 0.6x lens expanding your capabilties for high resolution form measurements. The advanced Focus Finder simplifies and speeds up measurement procedures.

Micro.View® is the cost-effective quality control instrument for inspecting precision engineered surfaces, roughness and micro topography in the field of manufacturing and research.