LAYER CHARACTERIZATIONMaterial analysis systemsOptical profilometers

MW-TopMap-Pro.Surf Profilometer for 3D form & flatness

Part Number

MW-TopMap-Pro.Surf

Designation

Profilometer for 3D form & flatness

Description

TopMap Pro.Surf and Pro.Surf are production-ready optical profilers for traceable and ultra-fast quality control measurements. Analyze 3D form parameters and flatness with utmost repeatability, capturing ~2M data points within just seconds.

The exceptionally large single field with 44 x 33 mm. misses no details, while True Stitching secures accurate data of up to 230 x 220 mm.. Automatic pattern recognition enables fast and efficient multi-sample measurements without the need for mechanical fixture. Reach recessed areas and inner surfaces with telecentric optics, covering up to 70 mm large steps. This Coherence Scanning Interferometer features the SST Smart Scanning Technology for seamless measurements on almost any material with one technology, perfectly handing altering reflectivities.

The large set of analysis routines enables easy and ISO conform evaluation of roughness and form parameters. The integrated recipe management simplifies routine inspections and ensures consistency, while 1-click-operations speed up pass-fail analysis on shop floor. The unique FTP accessory gathers Flatness, Thickness & Parallelism by measuring top and bottom surfaces of a sample in one shot. For noisy shop floors and disturbances, the patented ECT Environmental Compensation Technology secures stable measurement.

Technical Specifications

Measurement method

Coherence scanning interferometry

Z measurement range

70 mm

Measurement area

200 x 200 mm

Measurement noise

< 0.5 nm

Resolution

0.01 nm

Flatness deviation

< 75 nm

Flatness measurement repeatability

< 5 nm

Associated products

MW-TopMap-Micro.ViewOptical profilometer for 3D roughness

TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this Coherence Scanning interferometer.
The extended 100 mm large Z measurement range with Continuous Scanning Technology (CST) measures microstructures and textures of precision surfaces with sub-nm resolution. The convenient table-top setup features integrated electronics, with the advanced Focus Finder simplifying and speeding up the measurement procedure.

Benefit from the optional ECT Environmental Compensation Technology, enabling reliable and accurate measurement results even in noisy and challenging production environments. Add the custom TopMap 0.6x lens expanding your capabilties for high resolution form measurements. The advanced Focus Finder simplifies and speeds up measurement procedures.

Micro.View® is the cost-effective quality control instrument for inspecting precision engineered surfaces, roughness and micro topography in the field of manufacturing and research.