QUADPRO2A      Semi-automatic 4 point probe measurement under temperature

QUADPRO2A : Semi-automatic 4 point probe measurement under temperature
QUADPRO2A : Semi-automatic 4 point probe measurement under temperature

Part Number

QUADPRO2A

Designation

Semi-automatic 4 point probe measurement under temperature

Description

Semi-automatic 4-point in-line temperature measurement system on samples ranging from 10mm to 300mm in diameter.. Capable of measuring surface resistance ranges from 10μΩ/sq to 10GΩ/sq. Several versions possibles to optimize measurement accuracy according to the ranges measured.

Equipment feature:

• V/I measurement, sheet resistance, resistivity or thickness
• Mean, Standard Deviation, Minimum, Maximum and 3Sigma reports for the dataset
• Temperature Coefficient of Resistance (TCR) measurements
• Automated 2D mapping, 3D mapping and cross-section
• Ultra high precision and repeatability
• Comparative mapping

The TCR option

The Resistance Temperature Coefficient option integrates sample temperature control as well as automated injected current control and resistance calculations. Integrated with a thermal chuck system, the test automatically sweeps temperatures over a wide range without moving the test tips.
Measurements are taken at each target temperature and the results are plotted on a graph. The TCR is expressed in parts per million (PPM). Users define the temperature range, steps, and delay for each test point before taking a measurement. A variety of thermal chucks are available to set the range and resolution from room temperature to 300°C, with 1° resolution.
Data can be printed or exported to a spreadsheet for further analysis.

DOCUMENTS

Technical Specifications

Wafer size

Up to 300 "

Sheet resistance range

1 µohm/sq to 10 Gohm/sq

Sample holding

Vacuum

Movement

Semi-automatic

Compatibility

SP4 and HT4 probe head

SMU

Keithley 2400, 2600, 2182 or 2636

Software

Measurement management, calculation, analysis, mapping, temperature control

License

Multi-users

Parameters calculation

Res (Ω.cm), R (Ω/sq), V/I, T (cm)

Data export

CSV

Vacuum

25 in Hg - 1/4" OD

Associated products

4 point probe head

SP44 point probe head

4-point head for ambient temperature, usable on equipment of the Pack4PP, Quadpro series and or for separate use. The standard head is designed in delrin with 4 independent tips in tungsten or osmium. A bayonet and two screws make it easy to attach the tip to our 4-prong stand for precise and repeatable measurements.

Specifications:

• Material of the tips defined according to application & type of layer
• Choice of parameters: Tip spacing (pitch), tip fineness, tip pressure
• Terminations: Flying leads, banana plugs, BNC, triaxial cables, 9-pin connector...
Calibration wafer NIST certified

SRS3Calibration wafer NIST certified

This wafer is used to calibrate 4-point resistivity measurement systems. It has NIST certification.

Specifications:

• 3" (75mm) wafer
• NIST certification during 1 year
High temperature 4 point probe head

HT4High temperature 4 point probe head

4-point head for high temperature and high resistivity, usable on equipment of the Pack4PP, Quadpro series and or for separate use. The standard head is designed in macor with 4 independent tips in tungsten or osmium. A bayonet and two screws make it easy to attach the tip to our 4-prong stand for precise and repeatable measurements.

Specifications:

• Material of the tips defined according to the type of layer to be measured
• Choice of parameters: Tip spacing (pitch), tip fineness, tip pressure
• Terminations: Flying leads, Banana jacks, Triax...
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171