- Tips material is function of the electronic layer under measure
- Variety of spacing, tip materials and radius, needle pressure
- Termination with flying wires or Banana jacks or BNC or triax cables or 9-Pins connector...
Part Number
S302
Designation
4 point probe stand
APPLICATIONS
The configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 4, 6, 8 or 12 inches, the sample positioning is manual as well as the contact of the tips by a rotating lever.
- A micro-switch insures that the current will be injected only after contact of the 4-point probe head
- The measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family, which can be supplied if requested
- The system can be upgraded to include the measurement and display onto a PC
- Perfect tool for for laboratories, universities, research centers... in the material characterization.
MOST POPULAR REFERENCES
Wafer size
4, 6 or 8 "
Movement
Manual
Compatibility
SP4 and HT4 probe head
Connection
4 banana jack
Software
Optional
SMU
Optional