LAYER CHARACTERIZATIONFour point probe systemsManual systems

S302 4 point probe stand

Part Number

S302

Designation

4 point probe stand

APPLICATIONS

Manual 1 Point or few Points

Description

The configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 4, 6, 8 or 12 inches, the sample positioning is manual as well as the contact of the tips by a rotating lever.

- A micro-switch insures that the current will be injected only after contact of the 4-point probe head
- The measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family, which can be supplied if requested
- The system can be upgraded to include the measurement and display onto a PC
- Perfect tool for for laboratories, universities, research centers... in the material characterization.

DOCUMENTS

S302 brochure (pdf)

Technical Specifications

Wafer size

4, 6 or 8 "

Movement

Manual

Compatibility

SP4 and HT4 probe head

Connection

4 banana jack

Software

Optional

SMU

Optional

Associated products

SP4 - 4 point probe head

LAYER CHARACTERIZATIONFour point probe systemsFour point probe heads

Ambient 4-point probe head for ambient temperature, useable on Pack4PP and Quadpro series equipment or for separate uses. The standard head is molded in delrin with tungsten tips. A bayonet and two screws alllow the head to be fixed to our 4 points probe stand easily for precise and repeatable measurements.

- Tips material is function of the electronic layer under measure
- Variety of spacing, tip materials and radius, needle pressure
- Termination with flying wires or Banana jacks or BNC or triax cables or 9-Pins connector...

K2450 - Keithley sourcemeter integrated on Microworld products

Single channel laboratory equipment for various measurements

The rated output voltage varies between ± 20 mV and ± 200 V and the rated output current is ± 10 nA and ± 1 A.
It also offers a large dynamic range, which makes the 2450 Series model well suited for tabletop and system applications with low voltage requirements.

Applications : 4-point measurements, nanomaterials, semiconductor structures, measurement of energy efficiency and lighting, material characterisation, real current source, digital multimeter, trigger controller ...

For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

Products Categories

LAYER CHARACTERIZATION

COMPONENTS TESTÌNG AND BURN IN

BACK-END PROCESSING

PROBE TESTING

Applications

CHARACTERIZATION OF ELECTRONIC LAYERS

INSTRUMENTATION CONTROL

ELECTRICAL TESTS UNDER NEEDLES

TEST ON PACKAGED DEVICES

DICING OF SUBSTRATES