S725HT      Micropositioner S725 for high temperature

Description Technical Specifications Documents Associated Products

S725HT      Micropositioner S725 for high temperature

Description Technical Specifications Documents Associated Products

Part Number

S725HT

Designation

Micropositioner S725 for high temperature

Description

This economic micropositioner will allow probe tips to land on pads or lines down to 20 µm.

- Special model for temperature probe test measurement

Technical Specifications

Accuracy

< 10 µm

X-Axis Clearance

12.7 mm

Y-Axis Clearance

12.7 mm

Z-Axis Clearance

12.7 mm

Resolution

80 TPI

Knob

Right or Left

Basis style

Magnetic or vacuum

Max temperature

600 °C

Associated products

UxGB - Coaxial Probe holder with ceramic isolation
Specifically designed for low noise measurements, the coaxial probe holder allows probing at low leakage.
PTG20 - Tungsten probe tip
General purpose probe tip sharpened at one extremity, the body material (Tungsten) is strong enough to be bent into a variety of shapes.

- The standard application is probing on pads and/or internal lines
- Material Tungsten, length 38 mm, tip radius from 0.5µm to 100µm
- Nickel-plated option is available for body only (easy soldering), please add the suffix ''N'' to the P/N
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171