ACCESSORIES FOR PROBE STATIONSMicropositionersGeneral use

S725HT Micropositioner S725 for high temperature

Part Number

S725HT

Designation

Micropositioner S725 for high temperature

APPLICATIONS

Low-Leakage-Current Testing

IV / CV Measurements & Failure analysis

Description

This economic micropositioner will allow probe tips to land on pads or lines down to 20 µm.

- Special model for temperature probe test measurement

Technical Specifications

Accuracy

< 10 µm

X-Axis Clearance

12.7 mm

Y-Axis Clearance

12.7 mm

Z-Axis Clearance

12.7 mm

Resolution

80 TPI

Knob

Right or Left

Basis style

Magnetic or vacuum

Max temperature

600 °C

Associated products

UxGB - Coaxial Probe holder with ceramic isolation

ACCESSORIES FOR PROBE STATIONSProbe holders for micropositioners

Specifically designed for low noise measurements, the coaxial probe holder allows probing at low leakage.

PTG20 - Tungsten probe tip

TEST PROBESPassive probe tips

General purpose probe tip sharpened at one extremity, the body material (Tungsten) is strong enough to be bent into a variety of shapes.

- The standard application is probing on pads and/or internal lines
- Material Tungsten, length 38 mm, tip radius from 0.5µm to 100µm
- Nickel-plated option is available for body only (easy soldering), please add the suffix ''N'' to the P/N