PROBE TESTINGTest accessoriesMicropositioners

S725HT Micropositioner S725 for high temperature

Part Number

S725HT

Designation

Micropositioner S725 for high temperature

APPLICATIONS

Low-Leakage-Current Testing

IV / CV Measurements & Failure analysis

Description

This economic micropositioner will allow probe tips to land on pads or lines down to 20 µm.
Special model for temperature probe test measurement, up to 600°C.

Technical Specifications

Accuracy

5 µm

X-Axis Clearance

19 mm

Y-Axis Clearance

15 mm

Z-Axis Clearance

15 mm

Resolution

80 TPI

Knob

Right or Left

Basis style

Magnetic or vacuum

Maximum temperature

600 °C

Associated products

UxGBCoaxial Probe holder with ceramic isolation

This probe holder allows to mount a probe tip with an angle of 45°.

It is useful for low noise IV measurements with it insulation and for high temperature, up to 600°C.

PTG20Tungsten probe tip

General purpose probe tip sharpened at one extremity, the body material (tungsten) is strong enough to be bent into a variety of shapes.

- The standard application is probing on pads and/or internal lines
- Material tungsten, length 38 mm, tip radius from 0.5µm to 100µm
- Nickel-plated option is available for body only (easy soldering), please add the suffix ''N'' to the P/N

For technical and commercial information, quote, ordering or request of visit by our representative.
+33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171