PROBE TESTINGTest accessoriesMicropositioners

S725S Micropositioner S725 with spring head

Part Number

S725S

Designation

Micropositioner S725 with spring head

APPLICATIONS

Low-Leakage-Current Testing

IV / CV Measurements & Failure analysis

Description

This micropositioner will allow landing on pads or lines down to 20µm.
Spring head (for fragile surface or temperature), allows limiting the pressure of needles on the pads.

DOCUMENTS

S725 brochure (pdf)

Technical Specifications

Accuracy

5 µm

X-Axis Clearance

19 mm

Y-Axis Clearance

15 mm

Z-Axis Clearance

15 mm

Resolution

80 TPI

Knob

Right or Left

Basis style

Magnetic or vacuum

Head style

Srping head

Associated products

D3Dark box with platen

This small probe station has been designed for high themperature application, it includes a chuck (ambient or hot chuck) and a circular platen that allow several magnetic micropositioner.

- A microscope can be used to contact small pads
- An economical solution for a variety of probing applications

PTG20Tungsten probe tip

General purpose probe tip sharpened at one extremity, the body material (tungsten) is strong enough to be bent into a variety of shapes.

- The standard application is probing on pads and/or internal lines
- Material tungsten, length 38 mm, tip radius from 0.5µm to 100µm
- Nickel-plated option is available for body only (easy soldering), please add the suffix ''N'' to the P/N

UPStandard Probe holder with spring lock

This probe holder allows to mount a probe tip with an angle of 45°.

It is useful for standard IV measurements.
The tip holding is done by spring for a quick and safe assembly.