PROBE TESTINGProbe stationsManual probe stations

H150 4" manual probe station

Part Number

H150

Designation

4" manual probe station

APPLICATIONS

IV / CV Measurements & Failure analysis

Description

Easy use probe station for wafers up to 100 mm.

- XY chuck movement
- Quick platen lift
- Up to 6 micropositioners or a probecard
- Fixed microscope holder

DOCUMENTS

H150 brochure (pdf)

Technical Specifications

Sample holding

Vacuum ring, zone selection (pump not included)

Stage Drive

Manual

Chuck travel X-Y

100 mm

Chuck material

Nickel

Chuck stage Z travel

Chuck planarity adjustment

Yes

Planarity

< 10 µm

Theta range

360 Degree

Rotation lock

Contact/no contact platen lever

Repetability /- 1 µm

Platen material

Steel for vacuum or magnetic micropositioner

XY scope stage travel

Optional

Associated products

S725PMicropositioner S725 with pivot head

This economic micropositioner will allow landing on pads or lines down to 20 µm.
Pivot head (quick Z down before fine adjust, ideal for probe station).

PTG20Tungsten probe tip

General purpose probe tip sharpened at one extremity, the body material (tungsten) is strong enough to be bent into a variety of shapes.

- The standard application is probing on pads and/or internal lines
- Material tungsten, length 38 mm, tip radius from 0.5µm to 100µm
- Nickel-plated option is available for body only (easy soldering), please add the suffix ''N'' to the P/N

UPStandard Probe holder with spring lock

This probe holder allows to mount a probe tip with an angle of 45°.

It is useful for standard IV measurements.
The tip holding is done by spring for a quick and safe assembly.

S725SMicropositioner S725 with spring head

This micropositioner will allow landing on pads or lines down to 20µm.
Spring head (for fragile surface or temperature), allows limiting the pressure of needles on the pads.

SMZ171Stereozoom microscope

Designed for precision electronics applications, this trinocular microscope offers excellent image quality for the placement, positioning, and manipulation of micro-probes on a probe station.

Its optical system delivers a clear, detailed view of components and work areas, facilitating tasks that require high precision. The trinocular design also allows for the connection of a camera to view, record, or share operations in real time.

With its stereoscopic viewing capabilities and a depth of field optimized for precision work, the microscope enables accurate micro-probe positioning while maintaining excellent depth and distance perception.

It is ideally suited for microelectronics, assembly, inspection, testing, and prototyping tasks where precise movement and clear visibility of the work area are essential.

- Trinocular head for viewing and camera connection
- Stereoscopic viewing for excellent control of the work area
- Suitable for micro-probe placement and positioning
- Excellent visibility of miniature components and connections
- Long working distance (WD 110mm)
- Variety of stands and mounts available

Rugged, versatile, and built for technical environments, this microscope is an ideal tool for electronics and microelectronics professionals requiring precise visualization during delicate operations.
It enables greater control and precision when working with miniature components, while also offering the ability to document operations via the trinocular camera port.