PROBE TESTINGProbe stationsManual probe stations

CM170 High stability manual probe station

Part Number

CM170

Designation

High stability manual probe station

APPLICATIONS

IV / CV Measurements & Failure analysis

High Power Probing

Description

From two model combination, the CM170 probe stations allows stability and accuraccy for moderate price.

- Large platen for frequency extender head use
- Multiple applications (optical, probecards, HF...)

MOST POPULAR REFERENCES

CM170 : DC to 100 MHz measurements
WL170 : DC to 110 GHz measurements
WL170-THz : mmW up to 1.1 THz (special raised chuck)

DOCUMENTS

CM170 brochure (pdf)

Technical Specifications

Sample holding

Vacuum ring, zone selection

Stage Drive

Manual

Chuck travel X-Y

200 mm

Chuck material

Nickel

Chuck stage Z travel

Chuck planarity adjustment

Yes

Planarity

< 10 µm

Theta range

360 Degree

Rotation lock

Optional

Z range platen

38mm with lock

Contact/no contact platen lever

3 mm

Platen material

Steel for vacuum or magnetic micropositioner

Scope stage drive type

Manual

XY scope stage travel

X-Y 50x50mm - Resolution 2µm

Microscope lift

100mm (4 in) vertical Pneumatic

Raised chuck

Optional

Option

Probe card, dark box, themral chuck, triax chuck...

Associated products

PSM1000Turret microscope

Turret microscope for fine inspection and high magnifications.
The PSM1000 is useful for precision contact on very small surfaces.

- It can be used as a stand alone or mounted onto analytical probe station
- A range of accessories is available including a variety of objectives (NIR, NUV, polarizer, analyzer...)
- The trinocular head accepts a choice of digital cameras
- Spectroscopic applications available

MW-SCA50Coaxial HF-Low-current probe

The coaxial Probe is designed for low-level signal probing (lower than 10fA@150°C)

- The probe's single unit design is especially desirable for the best possible electrical characteristics
- The Coaxial Probe is also offered with optional Ground Plane, Kelvin and resistor series /parallel configurations
- The Probes are constructed of microwave-quality components with a 50 Ohm semi-rigid cable shield being achieved through the utilisation a Teflon dielectric
- The probe contact protrudes from the shielding by .150" (3 mm) to maintain low-level signal noise to the probe
- Tips available (replaceable) from 0.5 µm to 20 µm
- The connector is a standard SSMC

PTG20Tungsten probe tip

General purpose probe tip sharpened at one extremity, the body material (tungsten) is strong enough to be bent into a variety of shapes.

- The standard application is probing on pads and/or internal lines
- Material tungsten, length 38 mm, tip radius from 0.5µm to 100µm
- Nickel-plated option is available for body only (easy soldering), please add the suffix ''N'' to the P/N

SP100High precision micropositioner SP100

High-precision micropositioner with inline controls knobs, the SP100 will allow easy landing on pads as well as internal lines within micron accuracy.

- The down Z movement of the tip is totally vertical.
- The knobs with micrometric graduations (100TPI) allow an optimal density on the platen.
- Pivot head (Quick down Z for pre-positioning then fine movement) or Standard head with Z knob.

MS12ZMono zoom microscope

This microscope is composed by a single objective and an internal zoom.
It allows a wide range of magnification without turret disadvantage for probing application.

- Light and compact
- Large working distance WD (ideal for high frequencies measurements applications)
- C-mount for camera
- High brightness (LED optical fiber)