PROBE TESTINGTest accessoriesMicropositioners

SP100      High precision micropositioner SP100

SP100 : High precision micropositioner SP100
SP100 : High precision micropositioner SP100
SP100 : High precision micropositioner SP100
SP100 : High precision micropositioner SP100
SP100 : High precision micropositioner SP100
SP100 : High precision micropositioner SP100
SP100 : High precision micropositioner SP100
SP100 : High precision micropositioner SP100

Part Number

SP100

Designation

High precision micropositioner SP100

APPLICATIONS

IV / CV Measurements & Failure analysis
Low-Leakage-Current Testing
High Power Probing
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Description

High-precision micropositioner with inline controls knobs, the SP100 will allow easy landing on pads as well as internal lines within micron accuracy.

- The down Z movement of the tip is totally vertical.
- The knobs with micrometric graduations (100TPI) allow an optimal density on the platen.
- Pivot head (Quick down Z for pre-positioning then fine movement) or Standard head with Z knob.

MOST POPULAR REFERENCES

  • SP100PM : Pivot head, magnetic base
  • SP100PV : Pivot head, vacuum base
  • SP100SM : Vertical head, magnetic base
  • SP100SV : Verticale head, vacuum base
  • SP100TM : Articulated head, magnetic base
  • SP100TV : Articulated head, vacuum base

DOCUMENTS

mwdoc_titre  SP100 brochure (pdf)

Technical Specifications

Accuracy

1 µm

X-Axis Clearance

12.5 mm

Y-Axis Clearance

12.5 mm

Z-Axis Clearance

12.5 mm

Resolution

100 TPI

Knob

Inline

Basis style

Magnetic or vacuum

Head style

Pivot, Vertical or Articulated head

Associated products

Triax probe holder

TRXTriax probe holder

Very low-noise probe holder (± 2 fA when used with a triaxial chuck and in an electrically shielded environment).

Can be mount onto S725P, S926P, SP100P, SP150P micropositioners.
Coaxial HF-Low-current probe

MW-SCA50Coaxial HF-Low-current probe

The coaxial Probe is designed for low-level signal probing (lower than 10fA@150°C)

- The probe's single unit design is especially desirable for the best possible electrical characteristics
- The Coaxial Probe is also offered with optional Ground Plane, Kelvin and resistor series /parallel configurations
- The Probes are constructed of microwave-quality components with a 50 Ohm semi-rigid cable shield being achieved through the utilisation a Teflon dielectric
- The probe contact protrudes from the shielding by .150" (3 mm) to maintain low-level signal noise to the probe
- Tips available (replaceable) from 0.5 µm to 20 µm
- The connector is a standard SSMC
High stability manual probe station

CM170High stability manual probe station

From two model combination, the CM170 probe stations allows stability and accuraccy for moderate price.

- Large platen for frequency extender head use
- Multiple applications (optical, probecards, HF...)

MOST POPULAR REFERENCES

CM170 : DC to 100 MHz measurements
WL170 : DC to 110 GHz measurements
WL170-THz : mmW up to 1.1 THz (special raised chuck)
8

CM2108" high accuracy manual probe station

The Checkmate series represents the most accomplished probing stations, available for wafer up to 12".

- Upgradability from one version to another
- Manual or Semi-automatic version
- Test on Probecards available
- Optional thermal charactherization (-60°C to +300°C)
- High voltage (HV) and low current (fA) measurements possible
- Allows up to 8 DC micropositioners or probe card

MOST POPULAR REFERENCES

CM210 : Version 200 mm
CM310 : Version 300 mm
High voltage probe holder

HVPHigh voltage probe holder

This probe holder series allow high voltage measurements, up to 20KV.

Tip holding by spindle or by screw.
Useful for IV measurements on HV transistors and HV diodes.
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171