It measures parameters using Van Der Pauw method : resistivity, mobility, carrier concentration, hall effect... with constant current source and permanent magnets
The system provides an access to the true characterization of semiconductors layers, compounds, solar cells...
The typical configuration includes :
• Software + I-V, I-R curve tracing for ohmic contact check
• Magnet modul : 0.55T
• Easy clip holder and contact on the sample under test
• Measurement at ambient and temperature