WL1160B-8N      8" RF manual analytical probe station

WL1160B-8N : 8 WL1160B-8N : 8
WL1160B-8N : 8 WL1160B-8N : 8

Part Number

WL1160B-8N

Designation

8" RF manual analytical probe station

Description

Economical while professional prober for RF and Microwave probing applications, available for single die, partial or full wafer up to 8".

- DC to 110 GHz measurement
- Stable platen and specific anti-resonant chuck construction
- Individual chuck for RF probes with independant rotation
- Quick lift platen and fine Z adjustment
- Allows binocular or trinocular microscope (Tilt-back clearing option)
- Accept up to 4 RF micropositioners and 4 DC micropositioners simultaneously

MOST POPULAR REFERENCES


WL1160A : Moving of optical bridge for turret microscope
WL1160B : Moving of optical bridge for trinocular stereozoom microscope
WL1160C : Fixed optical bridge for trinocular stereozoom microscope

Technical Specifications

Sample size

200 mm

Sample holding

Vacuum hole, zone selection

Chuck travel X-Y

200 mm

Chuck material

Nickel

Resolution

<1μm (0.001mm) @ 250μm/rev

Chuck stage Z travel

No

Chuck planarity adjustment

Yes

Planarity

< 10 µm

Theta range

30° coarse - 15° fine

Rotation lock

Yes

Z range platen

38 mm

Contact/no contact platen lever

10 mm with a repeatability of +/- 1µm

Platen material

Steel for vacuum or magnetic micropositioner

XY scope stage travel

X-Y 50x50mm - Résolution 10µm

Calibration Chuck

Calibration chuck with independant angular setup

Associated products

RF & Microwave micropositioner

SM40RF & Microwave micropositioner

The SM40 micropositioner is specifically designed for RF probing, it has one inch translation capabilities in all axes and a cross-roller bearings to prevent accidentally moving the tip if bumped.

- Accepts all types of coplanar RF probes.
- Perfectly stable with screw-lock fixation on the platen (optional magnetic base).
- An integral co-planarity adjustment provides for adjusting multicontact planarities (GS, GSG, GSGSG configurations).
- It is available with various head configurations allowing the microwave head to be introduced from the front, rear.

RF probe 40 GHz

MWRF-40ARF probe 40 GHz

Serie of probes for RF Microwave applications up to 40GHz, GSG, GS, SG or "dual" configurations (dual = 2 probes on 1 positionner)

- These probes are available in different pitch from 25µm to 2540µm
- Various mounting styles for micropositioners
- Female K connector 2.9mm
- Available in BeCu, Nickel or Tungsten
- Non Magnetic option
- High temperature and high current / high voltage versions, please ask us
Calibration substrate for RF probe

MW-CSCalibration substrate for RF probe

Calibration substrate series for RF probes, that allow high accuracy measurements.

- GSG, GS, SG or dual (GSSG, GSGSG...) configurations
- Through, short, load (50ohms)...
- Gold plated pads
- Calibration kit for analyzer (R&S, HP...)
RF & Microwave micropositioner

SM90RF & Microwave micropositioner

The SM90 micropositioner is specifically designed for RF probing, it has one inch translation capabilities in all axes and a cross-roller bearings to prevent accidentally moving the tip if bumped.

- Accepts all types of coplanar RF probes.
- Perfectly stable with screw-lock fixation on the platen (optional magnetic base).
- An integral co-planarity adjustment provides for adjusting multicontact planarities (GS, GSG, GSGSG configurations).
- It is available with various head configurations allowing the microwave head to be introduced from the front, rear.
RF probe 67 GHz

MWRF-67ARF probe 67 GHz

Serie of probes for RF Microwave applications up to 67GHz, GSG, GS, SG or "dual" configurations (dual = 2 probes on 1 micropositionner)

- These probes are available in different pitches from 25µm to 1250µm
- Various mounting styles for micropositionners
- Female V connector 1.85mm
- Available in BeCu or Tungsten
- Non Magnetic option
- High temperature and High Power options, please ask us
Stereozoom microscope

SMZ171Stereozoom microscope

Stereozoom microscope with middle magnification for probe tip placement.

- High working distance (WD = 110mm)
- C-mount for digital camera (trinocular version)
- Several objectives and eyepieces for wide range of magnification
- LED or optical fiber illumination available
Active antivibration table

TA-VIS-7575Active antivibration table

The table allows pneumatic filtering of vibrations, the 4 dampers efficiently filter the mechanical noise from the ground or neighbourhood for an ultra fine probe analysis, inspection or assembly.

- Platens available in several dimensions upon size and weight of the equipment
- Individually adjustable air pressure sensors at each corner
Digital camera

MOTICAM1080XDigital camera

This camera is very helpfull for direct vision to put probes easily.

- Compatible with our trinoculars microscopes
- C mount
- Multi-outputs for direct vision on monitor (HDMI) and USB
For technical and commercial information, quote, ordering or request of visit by our representative.
+33 (0)476 561 617

5 rue de la Verrerie

38120 Le Fontanil-Cornillon

Grenoble / France

Fax : +33(0) 476 757 484

RCS Grenoble B 381 001 171 - APE 4652Z

TVA FR 48 381 001 171