PROBE TESTINGTest accessoriesSpecific chucks

HPCHUCK High power chuck

Part Number

HPCHUCK

Designation

High power chuck

APPLICATIONS

High Power Probing

Description

The high power chuck has been designed for use when probing at high voltage or high current.

- 150, 200 or 300 mm size available
- For very high voltage measurement (10KV)

Technical Specifications

Wafer size

150, 200 or 300 mm

Voltage range

10 KV

Connector

SHV

Option

Temparature, dark box

Associated products

The Kelvin-capable HCP high current probe is the only probe design on this type in the industry today. The multi-probe design distributes current among the contact points and heat sink remove heat from probe-pad interface to prevent overheating. The unique design gives the user the ability to have Kelvin access to device at the pad level.

- Specs PowerPro 3kV triax / 10kV coax, 450A pulsed / 10A DC
- Tungsten probes, ceramic body for high temperature use
- Mounting on RF positioner
- Complementary to our PowerPro probe systems

CM2508" semi-automatic probe station

Semi-automatic probe stations for full wafer electrical characterization up to 8" (200 mm).

- Software : mapping, auto-alignment, pattern recognition, autofocus...
- Probecard application available
- Temperature characterization up to +600°C
- High voltage (HV - 10kV) and low leakage (fA) measurements
- Tool developed for design validation (R&D) and yield monitoring (production)
- Configuration : up 10 ports DC/Kelvin
- Compatible with high performances ERS chuck (patented air cooling system, temperature from -60°C to +300°C)

MOST POPULAR REFERENCES

CM250 : Version 200 mm
CM350 : Version 300 mm

WL250-LE8" HF semi-automatic probe station with local enclosure

Semi-automatic probing stations for full wafer HF electrical characterization.

- Software : mapping, auto-alignment, pattern recognition, autofocus...
- Probecard application available
- Thermal characterization from -60°C to +300°C
- HF measurements up to 110 GHz
- Tool developed for design validation (R&D) and yield monitoring (production)
- Configuration : up 4 ports HF (N, S, E, W) and 4 DC
- Optional local enclosure for EMI shielding and light-tight

MOST POPULAR REFERENCES

WL250 : 200 mm version
WL350 : 300 mm version
WL250-LE : 200 mm with local enclosure
WL350-LE : 300 mm with local enclosure

HVPHigh voltage probe holder

This probe holder series allow high voltage measurements, up to 20KV.

Tip holding by spindle or by screw.
Useful for IV measurements on HV transistors and HV diodes.